Browsing by Subject "Integrated circuits -- Testing"

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Browsing by Subject "Integrated circuits -- Testing"

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  • Kennedy, Michael Peter (IEEE, 2000-02)
    A model of the linear R-2R ladder digital-to-analog converter (DAC) is developed in terms of the ratios of the effective resistances at the nodes of the ladder. This formulation demonstrates clearly why an infinite number ...
  • Wegener, Carsten; Kennedy, Michael Peter (IEEE, 2004-01)
    In this brief, we demonstrate the procedures of linear model-based testing for the example of a 12-b Nyquist-rate analog-to-digital converter (ADC). In a production test environment, we apply this technique to two wafer ...