Browsing by Subject "Specification test"

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Browsing by Subject "Specification test"

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  • Wegener, Carsten; Kennedy, Michael Peter (IEEE, 2004-01)
    In this brief, we demonstrate the procedures of linear model-based testing for the example of a 12-b Nyquist-rate analog-to-digital converter (ADC). In a production test environment, we apply this technique to two wafer ...