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Field-effect mobility extraction in nanowire field-effect transistors by combination of transfer characteristics and random telegraph noise measurements
Nazarov, Alexei N.
;
Ferain, Isabelle
;
Akhavan, Nima Dehdashti
;
Razavi, Pedram
;
Yu, Ran
;
Colinge, Jean-Pierre
(
AIP Publishing
,
2011
)
Improvement of carrier ballisticity in junctionless nanowire transistors
Akhavan, Nima Dehdashti
;
Ferain, Isabelle
;
Razavi, Pedram
;
Yu, Ran
;
Colinge, Jean-Pierre
(
AIP Publishing
,
2011
)
Random telegraph-signal noise in junctionless transistors
Nazarov, Alexei N.
;
Ferain, Isabelle
;
Akhavan, Nima Dehdashti
;
Razavi, Pedram
;
Yu, Ran
;
Colinge, Jean-Pierre
(
AIP Publishing
,
2011
)
Low-frequency noise in junctionless multigate transistors
Jang, Doyoung
;
Lee, Jae Woo
;
Lee, Chi-Woo
;
Colinge, Jean-Pierre
;
Montes, Laurent
;
Lee, Jung Il
;
Kim, Gyu Tae
;
Ghibaudo, G.
(
AIP Publishing
,
2011
)
A systematic study of (NH4)(2)S passivation (22%, 10%, 5%, or 1%) on the interface properties of the Al2O3/In0.53Ga0.47As/InP system for n-type and p-type In0.53Ga0.47As epitaxial layers
O'Connor, Éamon
;
Brennan, B.
;
Djara, Vladimir
;
Cherkaoui, Karim
;
Monaghan, Scott
;
Newcomb, Simon B.
;
Contreras, R.
;
Milojevic, M.
;
Hughes, Gregory
;
Pemble, Martyn E.
;
Wallace, R. M.
;
Hurley, Paul K.
(
AIP Publishing
,
2011
)
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Author
Colinge, Jean-Pierre (4)
Akhavan, Nima Dehdashti (3)
Ferain, Isabelle (3)
Razavi, Pedram (3)
Yu, Ran (3)
Nazarov, Alexei N. (2)
Brennan, B. (1)
Cherkaoui, Karim (1)
Contreras, R. (1)
Djara, Vladimir (1)
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Subject
MOSFETs (4)
Nanowires (3)
Capacitance (2)
Carrier mobility (2)
Doping (2)
Electric measurements (2)
1/f noise (1)
Atomic layer deposition (1)
Devices (1)
Excess noise (1)
... View More
Date Issued
2011 (5)
Funder
Science Foundation Ireland (5)
Seventh Framework Programme (5)
Centre National pour la Recherche Scientifique et Technique (1)
Fondation Nanosciences (1)
Higher Education Authority (1)
Korea Institute of Science and Technology (1)
National Research Foundation of Korea (1)
National Science Foundation (1)
Semiconductor Research Corporation (1)
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