General approach to the analysis of plasmonic structures using spectroscopic ellipsometry

Show simple item record

dc.contributor.author Verre, R.
dc.contributor.author Modreanu, Mircea
dc.contributor.author Ualibek, O.
dc.contributor.author Fox, Daniel J.
dc.contributor.author Fleischer, K.
dc.contributor.author Smith, C.
dc.contributor.author Zhang, Hongzhou
dc.contributor.author Pemble, Martyn E.
dc.contributor.author McGilp, J. F.
dc.contributor.author Shvets, I. V.
dc.date.accessioned 2014-01-30T10:02:16Z
dc.date.available 2014-01-30T10:02:16Z
dc.date.issued 2013-06
dc.identifier.citation VERRE, R., MODREANU, M., UALIBEK, O., FOX, D., FLEISCHER, K., SMITH, C., ZHANG, H., PEMBLE, M., MCGILP, J. F. & SHVETS, I. V. 2013. General approach to the analysis of plasmonic structures using spectroscopic ellipsometry. Physical Review B, 87, 235428. doi: 10.1103/PhysRevB.87.235428 en
dc.identifier.volume 87 en
dc.identifier.issued 23 en
dc.identifier.startpage 235428 en
dc.identifier.issn 1098-0121
dc.identifier.issn 1550-235X
dc.identifier.uri http://hdl.handle.net/10468/1348
dc.identifier.doi 10.1103/PhysRevB.87.235428
dc.description.abstract In this article a route to analyze the full optical response of plasmonic structures is developed. First, the simple case of an anisotropic thin plasmonic layer supported on a transparent substrate is analyzed by introducing a quantity named anisotropic surface excess function (ASEF). The spectral features are analyzed in terms of effective dielectric function, demonstrating a more direct relation with the plasmonic response of the layer. The formalism is then generalized using a transfer matrix method. The formalism developed is supported by experimental evidence obtained by measuring the response of anisotropic nanoparticle arrays grown at a glancing angle. The agreement between theory and experiment is clear, suggesting that SE can be conveniently employed to measure the spectroscopic response of plasmonic structures. It is also demonstrated that the figure of merit of the plasmonic resonance for refractive index sensing can be greatly improved, with optimized measurement configurations, using polarized spectroscopy. en
dc.description.sponsorship Science Foundation of Ireland, (06/IN.1/I91) (11/RFP.1/PHY/3047); Higher Education Authority (PRTLI 4 - INSPIRE programme); Government of the Republic of Kazakhstan (The Bolashak programme) en
dc.format.mimetype application/pdf en
dc.language.iso en en
dc.publisher American Physical Society en
dc.relation.uri http://link.aps.org/doi/10.1103/PhysRevB.87.235428
dc.rights ©2013 American Physical Society. en
dc.subject Plasmonics en
dc.subject Spectroscopic ellipsometry en
dc.title General approach to the analysis of plasmonic structures using spectroscopic ellipsometry en
dc.type Article (peer-reviewed) en
dc.internal.authorcontactother Martyn Pemble, Chemistry, University College Cork, Cork, Ireland. +353-21-490-3000 Email: martyn.pemble@tyndall.ie en
dc.internal.availability Full text available en
dc.date.updated 2013-12-18T15:20:58Z
dc.description.version Accepted Version en
dc.internal.rssid 218288143
dc.contributor.funder Higher Education Authority en
dc.contributor.funder Science Foundation Ireland en
dc.contributor.funder Government of the Republic of Kazakhstan en
dc.description.status Peer reviewed en
dc.identifier.journaltitle Physical Review B en
dc.internal.copyrightchecked No !!CORA!! Publisher website. Author manuscript on eprint servers. en
dc.internal.licenseacceptance Yes en
dc.internal.IRISemailaddress martyn.pemble@tyndall.ie en
dc.internal.IRISemailaddress mircea.modreanu@tyndall.ie


Files in this item

This item appears in the following Collection(s)

Show simple item record

This website uses cookies. By using this website, you consent to the use of cookies in accordance with the UCC Privacy and Cookies Statement. For more information about cookies and how you can disable them, visit our Privacy and Cookies statement