Linear model-based testing of ADC nonlinearities

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dc.contributor.author Wegener, Carsten
dc.contributor.author Kennedy, Michael Peter
dc.date.accessioned 2010-04-21T13:01:26Z
dc.date.available 2010-04-21T13:01:26Z
dc.date.issued 2004-01
dc.identifier.citation Wegener, C., Kennedy, M.P., 2004. Linear model-based testing of ADC nonlinearities. IEEE Transactions on Circuits and Systems I: Regular Papers, 51(1), pp. 213- 217. doi: 10.1109/TCSI.2003.821281 en
dc.identifier.volume 51 en
dc.identifier.issued 1 en
dc.identifier.startpage 213 en
dc.identifier.endpage 217 en
dc.identifier.issn 1549-8328
dc.identifier.uri http://hdl.handle.net/10468/161
dc.identifier.doi 10.1109/TCSI.2003.821281
dc.description.abstract In this brief, we demonstrate the procedures of linear model-based testing for the example of a 12-b Nyquist-rate analog-to-digital converter (ADC). In a production test environment, we apply this technique to two wafer lots of devices, and we establish that the model is robust with respect to its ability to reduce the uncertainty of the test outcome. Reducing this uncertainty is particularly beneficial for higher resolution devices, for which measurement noise increasingly corrupts the measured "signal" that is the nonlinearity of the device under test. en
dc.format.mimetype application/pdf en
dc.language.iso en en
dc.publisher IEEE en
dc.rights ©2004 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. en
dc.subject Linear modeling en
dc.subject Noise-induced test uncertainty en
dc.subject Specification test en
dc.subject Test cost reduction en
dc.subject.lcsh Integrated circuits -- Testing en
dc.subject.lcsh Analog-to-digital converters en
dc.title Linear model-based testing of ADC nonlinearities en
dc.type Article (peer-reviewed) en
dc.internal.authorcontactother Michael Peter Kennedy, Vice President Research, University College Cork, Cork, Ireland. +353-21-490-3000 Email: peter.kennedy@ucc.ie en
dc.internal.availability Full text available en
dc.date.updated 2010-03-26T13:51:06Z
dc.description.version Published Version en
dc.internal.rssid 347387
dc.contributor.funder Enterprise Ireland en
dc.contributor.funder Analog Devices B.V., Ireland en
dc.description.status Peer reviewed en
dc.identifier.journaltitle IEEE Transactions on Circuits and Systems I: Regular Papers en
dc.internal.IRISemailaddress peter.kennedy@ucc.ie en


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