Linear model-based testing of ADC nonlinearities
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Published Version
Date
2004-01
Authors
Wegener, Carsten
Kennedy, Michael Peter
Journal Title
Journal ISSN
Volume Title
Publisher
IEEE
Published Version
Abstract
In this brief, we demonstrate the procedures of linear model-based testing for the example of a 12-b Nyquist-rate analog-to-digital converter (ADC). In a production test environment, we apply this technique to two wafer lots of devices, and we establish that the model is robust with respect to its ability to reduce the uncertainty of the test outcome. Reducing this uncertainty is particularly beneficial for higher resolution devices, for which measurement noise increasingly corrupts the measured "signal" that is the nonlinearity of the device under test.
Description
Keywords
Linear modeling , Noise-induced test uncertainty , Specification test , Test cost reduction
Citation
Wegener, C., Kennedy, M.P., 2004. Linear model-based testing of ADC nonlinearities. IEEE Transactions on Circuits and Systems I: Regular Papers, 51(1), pp. 213- 217. doi: 10.1109/TCSI.2003.821281
Copyright
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