Coleman, Emma M.; Mirabelli, Gioele; Bolshakov, P.; Zhao, P.; Caruso, Enrico; Gity, Farzan; Monaghan, Scott; Cherkaoui, Karim; Balestra, V.; Wallace, R. M.; Young, C. D.; Duffy, Ray; Hurley, Paul K.
(Elsevier Ltd., 2021-06-09)
This paper reports on the study of inverted metal-oxide semiconductor (MOS) structures formed through mechanical exfoliation of MoS2 flakes onto Al2O3 or SiO2 layers grown on degenerately doped p type silicon substrates. ...