FIB patterning of stainless steel for the development of nano-structured stent surfaces for cardiovascular applications

Show simple item record Schmidt, Michael Nazneen, F. Galvin, Paul Petkov, Nikolay Holmes, Justin D.
dc.contributor.editor Wang, M. Z. 2016-04-20T14:04:31Z 2016-04-20T14:04:31Z 2013-12-06
dc.identifier.citation SCHMIDT, M., NAZNEEN, F., GALVIN, P., PETKOV, N. & HOLMES, J. D. 2013. FIB Patterning of Stainless Steel for the Development of Nano-structured Stent Surfaces for Cardiovascular Applications. In: WANG, M. Z. (ed.) FIB Nanostructures. Cham: Springer International Publishing. en
dc.identifier.volume 20 en
dc.identifier.startpage 391 en
dc.identifier.endpage 416 en
dc.identifier.isbn 978-3-319-02874-3
dc.identifier.doi 10.1007/978-3-319-02874-3_16
dc.description.abstract Stent implantation is a percutaneous interventional procedure that mitigates vessel stenosis, providing mechanical support within the artery and as such a very valuable tool in the fight against coronary artery disease. However, stenting causes physical damage to the arterial wall. It is well accepted that a valuable route to reduce in-stent re-stenosis can be based on promoting cell response to nano-structured stainless steel (SS) surfaces such as by patterning nano-pits in SS. In this regard patterning by focused ion beam (FIB) milling offers several advantages for flexible prototyping. On the other hand FIB patterning of polycrystalline metals is greatly influenced by channelling effects and redeposition. Correlative microscopy methods present an opportunity to study such effects comprehensively and derive structure–property understanding that is important for developing improved patterning. In this chapter we present a FIB patterning protocol for nano-structuring features (concaves) ordered in rectangular arrays on pre-polished 316L stainless steel surfaces. An investigation based on correlative microscopy approach of the size, shape and depth of the developed arrays in relation to the crystal orientation of the underlying SS domains is presented. The correlative microscopy protocol is based on cross-correlation of top-view scanning electron microscopy, electron backscattering diffraction, atomic force microscopy and cross-sectional (serial) sectioning. Various FIB tests were performed, aiming at improved productivity by preserving nano-size accuracy of the patterned process. The optimal FIB patterning conditions for achieving reasonably high throughput (patterned rate of about 0.03 mm2/h) and nano-size accuracy in dimensions and shapes of the features are discussed as well. en
dc.description.sponsorship Science Foundation Ireland (SFI Starting Investigator Research Grant (09/SIRG/I1621)); Higher Education Authority (INSPIRE Initiative) en
dc.format.mimetype application/pdf en
dc.language.iso en en
dc.publisher Springer International Publishing en
dc.relation.ispartof FIB Nanostructures - Lecture Notes in Nanoscale Science and Technology
dc.rights © Springer International Publishing Switzerland, 2013. The final publication is available at Springer via en
dc.subject Stents en
dc.subject FIB en
dc.subject Focused ion beam en
dc.subject Polycrystalline austenitic medical grade stainless steel 316L substrate en
dc.subject Nano-surface patterning with pits en
dc.subject Concaves en
dc.subject Holes en
dc.subject Endothelial cell adhesion en
dc.subject Correlative microscopy en
dc.subject EBSD en
dc.subject SEM en
dc.subject AFM en
dc.subject Serial FIB–SEM sectioning en
dc.title FIB patterning of stainless steel for the development of nano-structured stent surfaces for cardiovascular applications en
dc.type Book chapter en
dc.internal.authorcontactother Justin D. Holmes, Chemistry, University College Cork, Cork, Ireland. +353-21-490-3000 Email: en
dc.internal.availability Full text available en 2014-04-08T10:29:06Z
dc.description.version Accepted Version en
dc.internal.rssid 248927401
dc.contributor.funder Higher Education Authority en
dc.contributor.funder Science Foundation Ireland en
dc.contributor.funder National Biophotonics and Imaging Platform Ireland en
dc.description.status Peer reviewed en
dc.identifier.journaltitle Lecture Notes in Nanoscale Science and Technology en
dc.internal.copyrightchecked No !!CORA!! AV + 12 months + set statement en
dc.internal.licenseacceptance Yes en
dc.internal.placepublication Cham, Switzerland en
dc.internal.IRISemailaddress en

Files in this item

This item appears in the following Collection(s)

Show simple item record

This website uses cookies. By using this website, you consent to the use of cookies in accordance with the UCC Privacy and Cookies Statement. For more information about cookies and how you can disable them, visit our Privacy and Cookies statement