Formation and characterization of porous InP layers in KOH Solutions

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dc.contributor.author O'Dwyer, Colm
dc.contributor.author Buckley, D. Noel
dc.contributor.author Cunnane, V. J.
dc.contributor.author Sutton, David
dc.contributor.author Serantoni, M.
dc.contributor.author Newcomb, Simon B.
dc.date.accessioned 2016-07-14T15:04:54Z
dc.date.available 2016-07-14T15:04:54Z
dc.date.issued 2002-10
dc.identifier.citation O’Dwyer, C., Buckley, D. N., Cunnane, V. J., Sutton, D., Serantoni, M. and Newcomb, S. B. (2002) 'Formation and Characterization of Porous InP Layers in KOH Solutions', State-of-the-Art Program on Compound Semiconductors XXXVII (SOTAPOCS XXXVII) / Narrow Bandgap Optoelectronic Materials and Devices, 202nd ECS Meeting, Salt Lake City, Utah, 20-24 October, in Proceedings - Electrochemical Society, Vol. 14, pp. 259-269. ISBN 1-56677-306-5. en
dc.identifier.volume 14 en
dc.identifier.startpage 259 en
dc.identifier.isbn 1-56677-306-5
dc.identifier.uri http://hdl.handle.net/10468/2879
dc.description.abstract Porous InP layers were formed electrochemically on (100) oriented n-InP substrates in various concentrations of aqueous KOH under dark conditions. In KOH concentrations from 2 mol dm-3 to 5 mol dm-3, a porous layer is obtained underneath a dense near-surface layer. The pores within the porous layer appear to propagate from holes through the near-surface layer. Transmission electron microscopy studies of the porous layers formed under both potentiodynamic and potentiostatic conditions show that both the thickness of the porous layer and the mean pore diameter decrease with increasing KOH concentration. The degree of porosity, estimated to be 65%, was found to remain relatively constant for all the porous layers studied. en
dc.description.uri http://www.electrochem.org/dl/ma/202/symposia.htm en
dc.format.mimetype application/pdf en
dc.language.iso en en
dc.publisher Electrochemical Society en
dc.relation.uri http://ecsdl.org/site/misc/proceedings_volumes.xhtml
dc.rights © 2002, Electrochemical Society en
dc.subject Porosity en
dc.subject Porous InP layers en
dc.subject Transmission electron microscopy en
dc.subject Aqueous KOH en
dc.title Formation and characterization of porous InP layers in KOH Solutions en
dc.type Conference item en
dc.internal.authorcontactother Colm O'Dwyer, Chemistry, University College Cork, Cork, Ireland. +353-21-490-3000 Email: c.odwyer@ucc.ie en
dc.internal.availability Full text available en
dc.date.updated 2012-11-30T12:14:04Z
dc.description.version Accepted Version en
dc.internal.rssid 162343081
dc.description.status Peer reviewed en
dc.identifier.journaltitle Proceedings - Electrochemical Society en
dc.internal.copyrightchecked No. !!CORA!! Yes en
dc.internal.licenseacceptance Yes en
dc.internal.conferencelocation Salt Lake City, Utah en
dc.internal.IRISemailaddress c.odwyer@ucc.ie en


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