The structural and piezoresponse properties of c-axis-oriented Aurivillius phase Bi5Ti3FeO15 thin films deposited by atomic vapor deposition

Show simple item record

dc.contributor.author Zhang, Panfeng F.
dc.contributor.author Deepak, Nitin
dc.contributor.author Keeney, Lynette
dc.contributor.author Pemble, Martyn E.
dc.contributor.author Whatmore, Roger W.
dc.date.accessioned 2016-07-22T15:24:17Z
dc.date.available 2016-07-22T15:24:17Z
dc.date.issued 2012-09-11
dc.identifier.citation Zhang, P. F., Deepak, N., Keeney, L., Pemble, M. E. and Whatmore, R. W. (2012) 'The structural and piezoresponse properties of c-axis-oriented Aurivillius phase Bi5Ti3FeO15 thin films deposited by atomic vapor deposition'. Applied Physics Letters, 101, 112903. http://scitation.aip.org/content/aip/journal/apl/101/11/10.1063/1.4752007 en
dc.identifier.volume 101 en
dc.identifier.startpage 112903-1 en
dc.identifier.endpage 112903-4 en
dc.identifier.issn 0003-6951
dc.identifier.issn 1077-3118
dc.identifier.uri http://hdl.handle.net/10468/2933
dc.identifier.doi 10.1063/1.4752007
dc.description.abstract The deposition by atomic vapor deposition of highly c-axis-oriented Aurivillius phase Bi 5Ti 3FeO 15 (BTFO) thin films on (100) Si substrates is reported. Partially crystallized BTFO films with c-axis perpendicular to the substrate surface were first deposited at 610°C (8 excess Bi), and subsequently annealed at 820°C to get stoichiometric composition. After annealing, the films were highly c-axis-oriented, showing only (00l) peaks in x-ray diffraction (XRD), up to (0024). Transmission electron microscopy (TEM) confirms the BTFO film has a clear layered structure, and the bismuth oxide layer interleaves the four-block pseudoperovskite layer, indicating the n 4 Aurivillius phase structure. Piezoresponse force microscopy measurements indicate strong in-plane piezoelectric response, consistent with the c-axis layered structure, shown by XRD and TEM. en
dc.description.sponsorship Science Foundation Ireland (SFI FORME Strategic Research Cluster Award number 07/SRC/I1172); Higher Education Authority (HEA PRTLI 3 funding, and HEA PRTLI4Project INSPIRE.) en
dc.format.mimetype application/pdf en
dc.language.iso en en
dc.publisher AIP Publishing en
dc.rights © 2012 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. The following article appeared in Appl. Phys. Lett. 101, 112903 (2012) and may be found at http://scitation.aip.org/content/aip/journal/apl/101/11/10.1063/1.4752007 en
dc.subject Thin film structure en
dc.subject Thin films en
dc.subject Annealing en
dc.subject Liquid thin films en
dc.subject X-ray diffraction en
dc.subject Bi 5Ti 3FeO 15 en
dc.subject Bismuth titanate en
dc.subject Transmission electron microscopy en
dc.subject Atomic vapor deposition en
dc.title The structural and piezoresponse properties of c-axis-oriented Aurivillius phase Bi5Ti3FeO15 thin films deposited by atomic vapor deposition en
dc.type Article (peer-reviewed) en
dc.internal.authorcontactother Lynette Keeney, Tyndall Photonics, University College Cork, Cork, Ireland. +353-21-490-3000 Email: lynette.keeney@tyndall.ie en
dc.internal.availability Full text available en
dc.date.updated 2014-09-03T10:33:14Z
dc.description.version Published Version en
dc.internal.rssid 190495427
dc.internal.rssid 348782886
dc.internal.wokid 000309329300054
dc.contributor.funder Higher Education Authority en
dc.contributor.funder Science Foundation Ireland en
dc.description.status Peer reviewed en
dc.identifier.journaltitle Applied Physics Letters en
dc.internal.copyrightchecked No. !!CORA!! en
dc.internal.licenseacceptance Yes en
dc.internal.IRISemailaddress lynette.keeney@tyndall.ie en
dc.identifier.articleid 112903


Files in this item

This item appears in the following Collection(s)

Show simple item record

This website uses cookies. By using this website, you consent to the use of cookies in accordance with the UCC Privacy and Cookies Statement. For more information about cookies and how you can disable them, visit our Privacy and Cookies statement