Piezoresponse force microscopy investigations of Aurivillius phase thin films

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dc.contributor.author Keeney, Lynette
dc.contributor.author Zhang, Panfeng F.
dc.contributor.author Groh, Claudia
dc.contributor.author Pemble, Martyn E.
dc.contributor.author Whatmore, Roger W.
dc.date.accessioned 2016-08-16T08:46:43Z
dc.date.available 2016-08-16T08:46:43Z
dc.date.issued 2010-08-31
dc.identifier.citation Keeney, L., Zhang, P. F., Groh, C., Pemble, M. E. and Whatmore, R. W. (2010) ‘Piezoresponse force microscopy investigations of Aurivillius phase thin films’, Journal of Applied Physics, 108, 042004. http://dx.doi.org/10.1063/1.3474959 en
dc.identifier.volume 108 en
dc.identifier.startpage 042004-1 en
dc.identifier.endpage 042004-9 en
dc.identifier.issn 0021-8979
dc.identifier.issn 1089-7550
dc.identifier.uri http://hdl.handle.net/10468/2991
dc.identifier.doi 10.1063/1.3474959
dc.description.abstract The sol-gel synthesis and characterization of n≥3n≥3 Aurivillius phase thin filmsdeposited on Pt/Ti/SiO2–SiPt/Ti/SiO2–Si substrates is described. The number of perovskite layers, nn, was increased by inserting BiFeO3BiFeO3 into three layered Aurivillius phase Bi4Ti3O12Bi4Ti3O12 to form compounds such as Bi5FeTi3O15Bi5FeTi3O15 (n=4)(n=4). 30% of the Fe3+Fe3+ ions in Bi5FeTi3O15Bi5FeTi3O15 were substituted with Mn3+Mn3+ ions to form the structureBi5Ti3Fe0.7Mn0.3O15Bi5Ti3Fe0.7Mn0.3O15. The electromechanical responses of the materials were investigated using piezoresponse force microscopy and the results are discussed in relation to the crystallinity of the films as measured by x-ray diffraction. en
dc.description.sponsorship Science Foundation Ireland (SFI FORME Strategic Research Cluster Award No. 07/SRC/I1172); European Commission (European Union CAMELIA Specific Targeted Research or Innovation Project Contract No. STRP 033103 i) en
dc.format.mimetype application/pdf en
dc.language.iso en en
dc.publisher AIP Publishing en
dc.rights © 2010 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. The following article appeared in L. Keeney et al., J. Appl. Phys. 108, 042004 (2010) and may be found at http://dx.doi.org/10.1063/1.3474959 en
dc.subject Annealing en
dc.subject Atomic force microscopy en
dc.subject X-ray diffraction en
dc.subject Polarization en
dc.subject Sols en
dc.title Piezoresponse force microscopy investigations of Aurivillius phase thin films en
dc.type Article (peer-reviewed) en
dc.internal.authorcontactother Lynette Keeney, Tyndall Photonics, University College Cork, Cork, Ireland. +353-21-490-3000 Email: lynette.keeney@tyndall.ie en
dc.internal.availability Full text available en
dc.date.updated 2014-09-03T10:37:28Z
dc.description.version Published Version en
dc.internal.rssid 70045740
dc.contributor.funder Science Foundation Ireland en
dc.contributor.funder European Commission en
dc.description.status Peer reviewed en
dc.identifier.journaltitle Journal of Applied Physics en
dc.internal.copyrightchecked No. !!CORA!! Yes en
dc.internal.licenseacceptance Yes en
dc.internal.IRISemailaddress lynette.keeney@tyndall.ie en
dc.identifier.articleid 042004

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