42.6 Gbit/s fully integrated all-optical XOR gate

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dc.contributor.author Dailey, James M.
dc.contributor.author Ibrahim, Selwan K.
dc.contributor.author Manning, Robert J.
dc.contributor.author Webb, Rod P.
dc.contributor.author Lardenois, Sébastien
dc.contributor.author Maxwell, Graeme D.
dc.contributor.author Poustie, Alistair J.
dc.date.accessioned 2011-09-08T09:05:16Z
dc.date.available 2011-09-08T09:05:16Z
dc.date.issued 2009-09
dc.identifier.citation Dailey, J.M., Ibrahim, S.K., Manning, R.J., Webb, R.P., Lardenois, S., Maxwell, G.D., Poustie, A.J. (2009) '42.6 Gbit/s Fully Integrated All-Optical XOR Gate'. Electronics Letters, 45(20), 1047 - 1049. doi: 10.1049/el.2009.2036 en
dc.identifier.volume 45
dc.identifier.startpage 1047
dc.identifier.endpage 1049
dc.identifier.issn 0013-5194
dc.identifier.uri http://hdl.handle.net/10468/412
dc.identifier.doi 10.1049/el.2009.2036
dc.description.abstract We demonstrate an SOA-based all-optical high-speed Mach-Zehnder interferometer exclusive- OR (XOR) gate fabricated in a silica III-V hybrid-integration technology platform.  The device includes integrated time delays for rapid differential operation as well as integrated phase shifters for fine tuning of power splitters and interferometer bias enabling highly optimized XOR gate operation.  XOR functionality is verified through inspection of the output pulse sequence and the carrier-suppressed output spectrum.  A 2.3 dB penalty for a 42.6 Gb/s RZ-OOK signal at a 10-9 bit error rate is observed. en
dc.description.sponsorship Science Foundation Ireland (06/IN/I969) en
dc.format.mimetype application/pdf en
dc.language.iso en en
dc.publisher Institution of Engineering and Technology en
dc.rights © The Institution of Engineering and Technology 2009. This paper is a postprint of a paper submitted to and accepted for publication in Electronics Letters and is subject to Institution of Engineering and Technology Copyright. The copy of record is available at IET Digital Library en
dc.rights.uri http://www.ietdl.org/journals/doc/IEEDRL-home/info/support/copyinf.jsp en
dc.subject Mach-Zehnder interferometer en
dc.subject.lcsh Interferometers en
dc.subject.lcsh Semiconductors en
dc.subject.lcsh Optical amplifiers en
dc.title 42.6 Gbit/s fully integrated all-optical XOR gate en
dc.type Article (peer-reviewed) en
dc.internal.authorurl http://publish.ucc.ie/researchprofiles/E025/jamesdailey/home en
dc.internal.authorcontactother James Dailey, Photonic Systems Group, Tyndall National Institute, University College Cork, Cork, Ireland. Email: james.dailey@tyndall.ie en
dc.internal.authorcontactother Selwan K. Ibrahim, Photonic Systems Group, Tyndall National Institute, University College Cork, Cork, Ireland. E-mail: selwan.ibrahim@tyndall.ie en
dc.internal.authorcontactother Bob Manning, Tyndall National Institute, Lee Maltings, Cork, Ireland. Email: bob.manning@tyndall.ie en
dc.internal.authorcontactother Rod Webb, Tyndall National Institute, Lee Maltings, Cork, Ireland. Email: rod.webb@tyndall.ie en
dc.internal.availability Full text available en
dc.date.updated 2011-08-30T09:24:34Z
dc.description.version Accepted Version en
dc.internal.rssid 103228178
dc.contributor.funder Science Foundation Ireland en
dc.description.status Peer reviewed en
dc.identifier.journaltitle Electronics Letters
dc.internal.copyrightchecked Romeo en
dc.internal.IRISemailaddress james.dailey@tyndall.ie en

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