Growth and high frequency characterization of Mn doped sol-gel PbxSr1-xTiO3 for frequency agile applications

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dc.contributor.author Fragkiadakis, C.
dc.contributor.author Lueker, A.
dc.contributor.author Wright, R. V.
dc.contributor.author Floyd, Liam
dc.contributor.author Kirby, P. B.
dc.date.accessioned 2017-07-12T09:07:43Z
dc.date.available 2017-07-12T09:07:43Z
dc.date.issued 2009-03-16
dc.identifier.citation Fragkiadakis, C., Lüker, A., Wright, R. V., Floyd, L. and Kirby, P. B. (2009) 'Growth and high frequency characterization of Mn doped sol-gel PbxSr1−xTiO3 for frequency agile applications', Journal of Applied Physics, 105(6), pp. 061635. doi: 10.1063/1.3078767 en
dc.identifier.volume 105
dc.identifier.issued 7
dc.identifier.startpage 1
dc.identifier.endpage 7
dc.identifier.issn 0021-8979
dc.identifier.issn 1089-7550
dc.identifier.uri http://hdl.handle.net/10468/4216
dc.identifier.doi 10.1063/1.3078767
dc.description.abstract In pursuit of thin film ferroelectric materials for frequency agile applications that are both easily adapted to large area deposition and also high performance, an investigation has been carried out into sol-gel deposition of 3% Mn doped (Pb0.4Sr0.6)TiO3. Large area capability has been demonstrated by growth of films with good crystallinity and grain structure on 4 in. Si wafers. Metal-insulator-metal capacitors have also been fabricated and development of an improved de-embedding technique that takes parasitic impedances fully into account has enabled accurate extraction of the high frequency dielectric properties of the PbxSr1-xTiO3 films. Practically useful values of epsilon similar to 1000, tan delta similar to 0.03, and tunability similar to 50% have been obtained in the low gigahertz range (1-5 GHz). Peaks in the dielectric loss due to acoustic resonance have been modeled and tentatively identified as due to an electrostrictive effect with an electromechanical coupling coefficient of similar to 0.04 at an electric field of 240 kV/cm which is potentially useful for tunable thin film bulk acoustic wave devices. en
dc.description.sponsorship Engineering and Physical Sciences Research Council (EPSRC Grant No. EP/C520297/1) en
dc.format.mimetype application/pdf en
dc.language.iso en en
dc.publisher AIP Publishing en
dc.relation.ispartof 20th International Symposium on Integrated Ferroelectrics
dc.relation.uri http://aip.scitation.org/doi/abs/10.1063/1.3078767
dc.rights © 2009 American Institute of Physics, This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. The following article appeared in Fragkiadakis, C., Lüker, A., Wright, R. V., Floyd, L. and Kirby, P. B. (2009) 'Growth and high frequency characterization of Mn doped sol-gel PbxSr1−xTiO3 for frequency agile applications', Journal of Applied Physics, 105(6), pp. 061635. doi: 10.1063/1.3078767 and may be found at http://aip.scitation.org/doi/abs/10.1063/1.3078767 en
dc.subject Acoustic resonance en
dc.subject Acoustic waves en
dc.subject Dielectric losses en
dc.subject Doping profiles en
dc.subject Electrostriction en
dc.subject Ferroelectric capacitors en
dc.subject Ferroelectric thin films en
dc.subject Grain size en
dc.subject High-frequency effects en
dc.subject Lead compounds en
dc.subject Manganese en
dc.subject MIM structures en
dc.subject Permittivity en
dc.subject Platinum en
dc.subject Silicon en
dc.subject Silicon compounds en
dc.subject Sol-gel processing en
dc.subject Strontium compounds en
dc.subject Titanium en
dc.subject Capacitors en
dc.subject Electrodes en
dc.subject Thin film structure en
dc.subject Dielectric thin films en
dc.subject Thin film deposition en
dc.title Growth and high frequency characterization of Mn doped sol-gel PbxSr1-xTiO3 for frequency agile applications en
dc.type Article (peer-reviewed) en
dc.internal.authorcontactother Liam Floyd, Tyndall National Institute, University College Cork, Cork, Ireland +353-21-490-3000 , E-mail: liam.floyd@tyndall.ie en
dc.internal.availability Full text available en
dc.description.version Published Version en
dc.contributor.funder Engineering and Physical Sciences Research Council
dc.description.status Peer reviewed en
dc.identifier.journaltitle Journal of Applied Physics en
dc.internal.IRISemailaddress liam.floyd@tyndall.ie en
dc.identifier.articleid 61635


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