Microthermography of diode lasers: The impact of light propagation on image formation

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dc.contributor.author LeClech, Julien
dc.contributor.author Ziegler, Mathias
dc.contributor.author Mukherjee, Jayanta
dc.contributor.author Tomm, Jens W.
dc.contributor.author Elsaesser, Thomas
dc.contributor.author Landesman, Jean-Pierre
dc.contributor.author Corbett, Brian M.
dc.contributor.author McInerney, John G.
dc.contributor.author Reithmaier, Johann Peter
dc.contributor.author Deubert, Stefan
dc.contributor.author Forchel, Alfred
dc.contributor.author Nakwaski, Wlodzimierz
dc.contributor.author Sarzala, Robert P.
dc.date.accessioned 2017-07-12T09:07:44Z
dc.date.available 2017-07-12T09:07:44Z
dc.date.issued 2009-01-06
dc.identifier.citation LeClech, J., Ziegler, M., Mukherjee, J., Tomm, J. W., Elsaesser, T., Landesman, J.-P., Corbett, B., Mclnerney, J. G., Reithmaier, J. P., Deubert, S., Forchel, A., Nakwaski, W. and Sarzała, R. P. (2009) 'Microthermography of diode lasers: The impact of light propagation on image formation', Journal of Applied Physics, 105(1), pp. 014502. doi: 10.1063/1.3055356 en
dc.identifier.volume 105
dc.identifier.issued 6
dc.identifier.startpage 1
dc.identifier.endpage 6
dc.identifier.issn 0021-8979
dc.identifier.uri http://hdl.handle.net/10468/4218
dc.identifier.doi 10.1063/1.3055356
dc.description.abstract We analyze the effect of propagating infrared thermal radiation within a diode laser on its thermal image taken by a thermocamera. A ray-tracing analysis shows that this effect substantially influences image formation on a spatial scale of 10 mu m, i.e., in the domain of microthermography. The main parameter affecting the thermal radiation spread in the semitransparent semiconductor structure is the free carrier concentration in the substrate, governing its absorption. Two applications are presented: a quantum dot laser and a quantum-well laser, where independent thermal models are developed using the finite element method (FEM). Our ray-tracing analysis verifies the FEM simulated temperature profiles by interlinking them to experimental temperature maps obtained through microthermography. This represents a versatile experimental method for extracting reliable bulk-temperature data from diode lasers on a microscopic scale. en
dc.description.sponsorship European Commission (IST-2005-035266); en
dc.format.mimetype application/pdf en
dc.language.iso en en
dc.publisher AIP Publishing en
dc.relation.uri http://aip.scitation.org/doi/abs/10.1063/1.3055356
dc.rights © 2009 American Institute of Physics, This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. The following article appeared in LeClech, J., Ziegler, M., Mukherjee, J., Tomm, J. W., Elsaesser, T., Landesman, J.-P., Corbett, B., Mclnerney, J. G., Reithmaier, J. P., Deubert, S., Forchel, A., Nakwaski, W. and Sarzała, R. P. (2009) 'Microthermography of diode lasers: The impact of light propagation on image formation', Journal of Applied Physics, 105(1), pp. 014502 and may be found at http://aip.scitation.org/doi/abs/10.1063/1.3055356 en
dc.subject High-Power en
dc.subject Epitaxy en
dc.subject Channel waveguidesIon implantation en
dc.subject Field emission microscopy en
dc.subject Thermal imaging en
dc.subject Thermal radiation en
dc.subject Laser diodes en
dc.subject Quantum dots en
dc.title Microthermography of diode lasers: The impact of light propagation on image formation en
dc.type Article (peer-reviewed) en
dc.internal.authorcontactother Brian Corbett, Tyndall National Institute, University College Cork, Cork, Ireland +353-21-490-3000 E-mail: brian.corbett@tyndall.ie en
dc.internal.availability Full text available en
dc.description.version Published Version en
dc.contributor.funder Sixth Framework Programme
dc.description.status Peer reviewed en
dc.identifier.journaltitle Journal of Applied Physics en
dc.internal.IRISemailaddress brian.corbett@tyndall.ie en
dc.identifier.articleid 14502


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