Two-dimensional carrier density distribution inside a high power tapered laser diode

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dc.contributor.author Pagano, Roberto
dc.contributor.author Ziegler, Mathias
dc.contributor.author Tomm, Jens W.
dc.contributor.author Esquivias, I.
dc.contributor.author Tijero, J. M. G.
dc.contributor.author O'Callaghan, James R.
dc.contributor.author Michel, N.
dc.contributor.author Krakowski, M.
dc.contributor.author Corbett, Brian M.
dc.date.accessioned 2017-07-28T11:04:40Z
dc.date.available 2017-07-28T11:04:40Z
dc.date.issued 2011
dc.identifier.citation Pagano, R., Ziegler, M., Tomm, J. W., Esquivias, I., Tijero, J. M. G., O’Callaghan, J. R., Michel, N., Krakowski, M. and Corbett, B. (2011) 'Two-dimensional carrier density distribution inside a high power tapered laser diode', Applied Physics Letters, 98(22), pp. 221110. doi: 10.1063/1.3596445 en
dc.identifier.volume 98
dc.identifier.issued 22
dc.identifier.startpage 1
dc.identifier.endpage 3
dc.identifier.issn 0003-6951
dc.identifier.issn 1077-3118
dc.identifier.uri http://hdl.handle.net/10468/4320
dc.identifier.doi 10.1063/1.3596445
dc.description.abstract The spontaneous emission of a GaAs-based tapered laser diode emitting at lambda = 1060 nm was measured through a window in the transparent substrate in order to study the carrier density distribution inside the device. It is shown that the tapered geometry is responsible for nonuniform amplification of the spontaneous/stimulated emission which in turn influences the spatial distribution of the carriers starting from below threshold. The carrier density does not clamp at the lasing threshold and above it the device shows lateral spatial hole-burning caused by high stimulated emission along the cavity center. (C) 2011 American Institute of Physics. (doi: 10.1063/1.3596445) en
dc.description.sponsorship European Commission (European Union project WWW.BRIGHTER.EU Contract No. IST-2005-035266) en
dc.format.mimetype application/pdf en
dc.language.iso en en
dc.publisher AIP Publishing en
dc.relation.uri http://aip.scitation.org/doi/abs/10.1063/1.3596445
dc.rights © 2011 American Institute of Physics.This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. The following article appeared in Pagano, R., Ziegler, M., Tomm, J. W., Esquivias, I., Tijero, J. M. G., O’Callaghan, J. R., Michel, N., Krakowski, M. and Corbett, B. (2011) 'Two-dimensional carrier density distribution inside a high power tapered laser diode', Applied Physics Letters, 98(22), pp. 221110 and may be found at http://aip.scitation.org/doi/abs/10.1063/1.3596445 en
dc.subject Spontaneous emission en
dc.subject Semiconductor-lasers en
dc.subject Carrier density en
dc.subject Spontaneous emission en
dc.subject Stimulated emission en
dc.subject Charge coupled devices en
dc.subject Optical resonators en
dc.title Two-dimensional carrier density distribution inside a high power tapered laser diode en
dc.type Article (peer-reviewed) en
dc.internal.authorcontactother James O'Callaghan, Tyndall National Institute, University College Cork, Cork, Ireland +353 (0)21 2346319, Email: james.ocallaghan@tyndall.ie en
dc.internal.availability Full text available en
dc.description.version Published Version en
dc.internal.wokid WOS:000291405700010
dc.contributor.funder European Commission
dc.description.status Peer reviewed en
dc.identifier.journaltitle Applied Physics Letters en
dc.internal.IRISemailaddress james.ocallaghan@tyndall.ie en
dc.identifier.articleid 221110


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