Carrier-induced refractive index in quantum dot structures due to transitions from discrete quantum dot levels to continuum states

Loading...
Thumbnail Image
Files
3378.pdf(209.92 KB)
Published Version
Date
2004
Authors
Uskov, Alexander V.
O'Reilly, Eoin P.
McPeake, Dermot
Ledentsov, Nikolai N.
Bimberg, D.
Huyet, Guillaume
Journal Title
Journal ISSN
Volume Title
Publisher
AIP Publishing
Published Version
Research Projects
Organizational Units
Journal Issue
Abstract
The carrier-induced refractive index in quantum dot (QD) structures due to optical transitions from QD levels to continuum states is considered. It is shown that, for large photon energies, the refractive index change is given asymptotically by the Drude formula. Calculations of the linewidth enhancement factor, alpha, show that alphasimilar to1 due to this contribution to the total refractive index. Furthermore, for highly localized QD states, the absorption coefficient at the photon energies similar to0.8-1.0 eV due to these transitions can be on the order of 10(3) m(-1). (C) 2004 American Institute of Physics. (DOI: 10.1063/1.1639933)
Description
Keywords
Linewidth enhancement factor , Semiconductor-laser , Filamentation , Dependence , Gain , Quantum dots , Refractive index , Photons , Absorption coefficient , Linewidths
Citation
Uskov, A. V., O’Reilly, E. P., McPeake, D., Ledentsov, N. N., Bimberg, D. and Huyet, G. (2004) 'Carrier-induced refractive index in quantum dot structures due to transitions from discrete quantum dot levels to continuum states', Applied Physics Letters, 84(2), pp. 272-274. doi: 10.1063/1.1639933
Copyright
© 2004 American Institute of Physics.This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. The following article appeared in Uskov, A. V., O’Reilly, E. P., McPeake, D., Ledentsov, N. N., Bimberg, D. and Huyet, G. (2004) 'Carrier-induced refractive index in quantum dot structures due to transitions from discrete quantum dot levels to continuum states', Applied Physics Letters, 84(2), pp. 272-274 and may be found at http://aip.scitation.org/doi/abs/10.1063/1.1639933