Comparing leakage currents and dark count rates in Geiger-mode avalanche photodiodes

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dc.contributor.author Jackson, Jennifer C.
dc.contributor.author Hurley, Paul K.
dc.contributor.author Lane, Bill
dc.contributor.author Mathewson, Alan
dc.contributor.author Morrison, Alan P.
dc.date.accessioned 2017-07-28T13:29:55Z
dc.date.available 2017-07-28T13:29:55Z
dc.date.issued 2002
dc.identifier.citation Jackson, J. C., Hurley, P. K., Lane, B., Mathewson, A. and Morrison, A. P. (2002) 'Comparing leakage currents and dark count rates in Geiger-mode avalanche photodiodes', Applied Physics Letters, 80(22), pp. 4100-4102. doi: 10.1063/1.1483119 en
dc.identifier.volume 80
dc.identifier.issued 22
dc.identifier.startpage 4100
dc.identifier.endpage 4102
dc.identifier.issn 0003-6951
dc.identifier.issn 1077-3118
dc.identifier.uri http://hdl.handle.net/10468/4405
dc.identifier.doi 10.1063/1.1483119
dc.description.abstract This letter presents an experimental study of dark count rates and leakage current in Geiger-mode avalanche photodiodes (GM APD). Experimental results from circular diodes over a range of areas (20-500 mum diam), exhibit leakage current levels orders of magnitude higher than anticipated from dark count rates. Measurements of the area and peripheral components of the leakage current indicate that the majority of the current in reverse bias does not enter the high-field region of the diode, and therefore, does not contribute to the dark count rate. Extraction of the area leakage current term from large-area devices (500 mum) corresponds well with the measured dark count rates on smaller devices (20 mum). Finally, the work indicates how dark count measurements represent 10(-18) A levels of leakage current detection in GM APDs. (C) 2002 American Institute of Physics. (DOI: 10.1063/1.1483119) en
dc.format.mimetype application/pdf en
dc.language.iso en en
dc.publisher AIP Publishing en
dc.relation.uri http://aip.scitation.org/doi/abs/10.1063/1.1483119
dc.rights © 2002 American Institute of Physics.This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. The following article appeared in Jackson, J. C., Hurley, P. K., Lane, B., Mathewson, A. and Morrison, A. P. (2002) 'Comparing leakage currents and dark count rates in Geiger-mode avalanche photodiodes', Applied Physics Letters, 80(22), pp. 4100-4102 and may be found at http://aip.scitation.org/doi/abs/10.1063/1.1483119 en
dc.subject Accurate extraction en
dc.subject Junction en
dc.subject Leakage currents en
dc.subject Avalanche photodiodes en
dc.subject Electric measurements en
dc.title Comparing leakage currents and dark count rates in Geiger-mode avalanche photodiodes en
dc.type Article (peer-reviewed) en
dc.internal.authorcontactother Paul Hurley, Tyndall National Institute, University College Cork, Cork, Ireland +353 21 490 3000, Email: paul.hurley@tyndall.ie en
dc.internal.availability Full text available en
dc.description.version Published Version en
dc.internal.rssid 421653811
dc.internal.wokid WOS:000175771800006
dc.description.status Peer reviewed en
dc.identifier.journaltitle Applied Physics Letters en
dc.internal.IRISemailaddress paul.hurley@tyndall.ie en
dc.internal.IRISemailaddress a.morrison@ucc.ie en


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