Direct measurement of room-temperature nondiffusive thermal transport over micron distances in a silicon membrane

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dc.contributor.author Johnson, Jeremy A.
dc.contributor.author Maznev, A. A.
dc.contributor.author Cuffe, John
dc.contributor.author Eliason, Jeffrey K.
dc.contributor.author Minnich, Austin J.
dc.contributor.author Kehoe, Timothy
dc.contributor.author Sotomayor Torres, Clivia M.
dc.contributor.author Chen, Gang
dc.contributor.author Nelson, Keith A.
dc.date.accessioned 2017-09-04T09:02:30Z
dc.date.available 2017-09-04T09:02:30Z
dc.date.issued 2013
dc.identifier.citation Johnson, J. A., Maznev, A. A., Cuffe, J., Eliason, J. K., Minnich, A. J., Kehoe, T., Torres, C. M. S., Chen, G. and Nelson, K. A. (2013) 'Direct measurement of room-temperature nondiffusive thermal transport over micron distances in a silicon membrane', Physical Review Letters, 110(2), 025901 (5pp). doi: 10.1103/PhysRevLett.110.025901 en
dc.identifier.volume 110
dc.identifier.issued 2
dc.identifier.issn 0031-9007
dc.identifier.uri http://hdl.handle.net/10468/4621
dc.identifier.doi 10.1103/PhysRevLett.110.025901
dc.description.abstract The "textbook" phonon mean free path of heat carrying phonons in silicon at room temperature is similar to 40 nm. However, a large contribution to the thermal conductivity comes from low-frequency phonons with much longer mean free paths. We present a simple experiment demonstrating that room-temperature thermal transport in Si significantly deviates from the diffusion model already at micron distances. Absorption of crossed laser pulses in a freestanding silicon membrane sets up a sinusoidal temperature profile that is monitored via diffraction of a probe laser beam. By changing the period of the thermal grating we vary the heat transport distance within the range similar to 1-10 mu m. At small distances, we observe a reduction in the effective thermal conductivity indicating a transition from the diffusive to the ballistic transport regime for the low-frequency part of the phonon spectrum. DOI: 10.1103/PhysRevLett.110.025901 en
dc.description.sponsorship U.S. Department of Energy/Basic Energy Sciences (DE-SC0001299/DE-FG02-09ER46577); Ministerio de Economía y Competitividad (ACPHIN, Contract No. FIS2009-150); Generalitat de Catalunya (AGAUR, 2009-SGR-150) en
dc.format.mimetype application/pdf en
dc.language.iso en en
dc.publisher American Physical Society en
dc.relation.uri https://journals.aps.org/prl/abstract/10.1103/PhysRevLett.110.025901
dc.rights © 2013, American Physical Society en
dc.subject Thin films en
dc.subject Conduction en
dc.subject Scattering en
dc.subject Gratings en
dc.subject Dynamics en
dc.subject Carrier en
dc.title Direct measurement of room-temperature nondiffusive thermal transport over micron distances in a silicon membrane en
dc.type Article (peer-reviewed) en
dc.internal.authorcontactother John Cuffe, Tyndall National Institute, University College Cork, Cork, Ireland. +353-21-490-3000. Email: john.cuffe@tyndall.ie en
dc.internal.availability Full text available en
dc.description.version Published Version en
dc.internal.wokid WOS:000313336500009
dc.contributor.funder Basic Energy Sciences
dc.contributor.funder U.S. Department of Energy
dc.contributor.funder Seventh Framework Programme
dc.contributor.funder Ministerio de Economía y Competitividad
dc.contributor.funder Generalitat de Catalunya
dc.description.status Peer reviewed en
dc.identifier.journaltitle Physical Review Letters en
dc.internal.IRISemailaddress john.cuffe@tyndall.ie en
dc.identifier.articleid 25901
dc.relation.project info:eu-repo/grantAgreement/EC/FP7::SP1::ICT/257375/EU/Beyond CMOS Nanodevices for Adding Functionalitiesto CMOS/NANOFUNCTION
dc.relation.project info:eu-repo/grantAgreement/EC/FP7::SP1::ICT/233883/EU/TAILoring photon-phonon interaction in silicon PHOXonic crystals/TAILPHOX
dc.relation.project info:eu-repo/grantAgreement/EC/FP7::SP1::ICT/256959/EU/Nanoscale energy management for powering ICT devices/NANOPOWER


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