Co-based amorphous thin films on silicon with soft magnetic properties

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Co-based amorphous thin films on silicon with soft magnetic properties

Masood, Ansar; McCloskey, Paul; Ó Mathúna, S. Cian; Kulkarni, Santosh
Date: 2017
Copyright: © 2017, the Authors. All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
Copyright information: http://creativecommons.org/licenses/by/4.0/
Related: http://aip.scitation.org/doi/10.1063/1.5007733
Citation: Masood, A., McCloskey, P., Mathúna, C. Ó. and Kulkarni, S. (2018) 'Co-based amorphous thin films on silicon with soft magnetic properties', AIP Advances, 8(5), 056109(6pp). doi: 10.1063/1.5007733
Published Version: 10.1063/1.5007733

Abstract:

The present work investigates the emergence of multiple modes in the high-frequency permeability spectrum of Co-Zr-Ta-B amorphous thin films. Amorphous thin films of different thicknesses (t=100-530 nm) were deposited by DC magnetron sputtering. Their static and dynamic soft magnetic properties were investigated to explore the presence of multi-magnetic phases in the films. A two-phase magnetic behavior of the thicker films (≥333 nm) was revealed by the in-plane hysteresis loops. Multiple resonance peaks were observed in the high-frequency permeability spectrum of the thicker films. The thickness dependent multiple resonance peaks below the main ferromagnetic resonance (FMR) can be attributed to the two-phase magnetic behaviors of the films.

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© 2017, the Authors. All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). Except where otherwise noted, this item's license is described as © 2017, the Authors. All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
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