High frequency, single/dual phases, large AC/DC signal power characterization for two phase on-silicon coupled inductors

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Date
2017-05-18
Authors
Fernandez, C.
Pavlović, Zoran
Kulkarni, Santosh
McCloskey, Paul
Ó Mathúna, S. Cian
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Institute of Electrical and Electronics Engineers (IEEE)
Published Version
10.1109/APEC.2017.7931048
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Abstract
In this work, a new set-up is presented to characterize the large signal electrical parameters of on-Silicon integrated coupled inductors for Power Supply on Chip. The proposed system is suitable to perform the measurements under different large-signal test conditions given by the dc bias current up to 2 A and ac current through one or both windings, with amplitudes ranging from 0 A to 0.5 A at frequencies up to 120 MHz. Since a key issue when measuring at high-frequencies is the error due to the attenuation and time skew between the channels, an additional test is performed to characterize the measurement system and compensate the voltage and current waveforms.
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Keywords
Impedance measurement , Integrated magnetics , Thinfilm inductors , Large signal testing , Current measurement , Voltage measurement , Probes , Inductors , Frequency measurement , Inductance , Impedance
Citation
Fernandez, C., Pavlović, Z., Kulkarni, S., McCloskey, P. and O'Mathúna, C. (2017) 'High frequency, single/dual phases, large AC/DC signal power characterization for two phase on-silicon coupled inductors', 2017 IEEE Applied Power Electronics Conference and Exposition (APEC), Tampa, FL, USA, 26-30 March. doi:10.1109/APEC.2017.7931048
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https://hdl.handle.net/10468/5563
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Tyndall National Institute - Conference Items
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