Real-time experimental measurement of swept source VCSEL properties relevant to OCT imaging

Show simple item record Butler, Thomas P. Slepneva, Svetlana McNamara, P. M. Neuhaus, K. Goulding, David Leahy, M. Huyet, G. 2018-06-15T11:47:14Z 2018-06-15T11:47:14Z 2017
dc.identifier.citation Butler, T. P., Slepneva, S., McNamara, P. M., Neuhaus, K., Goulding, D., Leahy, M. and Huyet, G. (2017) 'Real-time experimental measurement of swept source VCSEL properties relevant to OCT imaging', IEEE Photonics Journal, 9(5), 1505810 (11pp). doi: 10.1109/JPHOT.2017.2752644 en
dc.identifier.volume 9
dc.identifier.issued 5
dc.identifier.startpage 1
dc.identifier.endpage 11
dc.identifier.issn 1943-0655
dc.identifier.doi 10.1109/JPHOT.2017.2752644
dc.description.abstract A real-time study of the dynamic properties of a frequency swept vertical cavity surface emitting laser (VCSEL) is presented. Such tunable laser sources have previously been shown to provide long coherence lengths and improved performance in metrology and imaging applications. Single-shot interferometric reconstruction of both the phase and intensity of the swept source allows for experimental measurement of the full complex electric field over multiple sweep periods. Access to the electric field enables direct measurement of laser properties that can be related to the imaging performance of the laser when used in a swept source optical coherence tomography application. Both inter-sweep and intra-sweep characterization is possible, including determination of the instantaneous spectral shape, sweep rate, linewidth, coherence roll-off, and point spread function. en
dc.description.sponsorship Higher Education Authority / Irish Government / European Commission (PRTLI Cycle 4 - National Biophotonics Imaging Platform) en
dc.format.mimetype application/pdf en
dc.language.iso en en
dc.publisher Institute of Electrical and Electronics Engineers (IEEE) en
dc.rights © 2017, IEEE. Translations and content mining are permitted for academic research only. Personal use is also permitted, but republication/redistribution requires IEEE permission. See for more information. en
dc.subject Semiconductor lasers en
dc.subject Optical coherence tomography en
dc.subject OCT en
dc.title Real-time experimental measurement of swept source VCSEL properties relevant to OCT imaging en
dc.type Article (peer-reviewed) en
dc.internal.authorcontactother Thomas Butler, Tyndall National Institute, University College Cork, Cork, Ireland +353-21-490-3000 Email: en
dc.internal.availability Full text available en
dc.description.version Published Version en
dc.contributor.funder Science Foundation Ireland
dc.contributor.funder National University of Ireland, Galway
dc.contributor.funder University Foundation Galway
dc.contributor.funder University of Limerick
dc.contributor.funder Higher Education Authority
dc.contributor.funder European Commission
dc.contributor.funder University of Limerick Foundation
dc.description.status Peer reviewed
dc.identifier.journaltitle IEEE Photonics Journal en
dc.internal.IRISemailaddress en
dc.identifier.articleid 1505810
dc.relation.project info:eu-repo/grantAgreement/SFI/SFI Research Centres/12/RC/2276/IE/I-PIC Irish Photonic Integration Research Centre/
dc.relation.project info:eu-repo/grantAgreement/SFI/SFI Principal Investigator Programme (PI)/11/PI/1152/IE/Frequency Combs Generated by Semiconductor Lasers for Metrology And Telecommunications/

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