Real-time dark count compensation and temperature monitoring using dual SPADs on the same chip

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dc.contributor.author Morrison, Alan P.
dc.contributor.author Deng, Shijie
dc.date.accessioned 2018-06-28T13:24:54Z
dc.date.available 2018-06-28T13:24:54Z
dc.date.issued 2018-04-12
dc.identifier.citation Deng, S. and Morrison, A. P. (2018) 'Real-time dark count compensation and temperature monitoring using dual SPADs on the same chip', Electronics Letters, 54(10), pp. 642-643, http://digital-library.theiet.org/content/journals/10.1049/el.2018.0341. en
dc.identifier.volume 54 en
dc.identifier.issued 10 en
dc.identifier.startpage 642 en
dc.identifier.endpage 643 en
dc.identifier.issn 0013-5194
dc.identifier.uri http://hdl.handle.net/10468/6386
dc.identifier.doi 10.1049/el.2018.0341
dc.description.abstract Dual single-photon avalanche photodiodes (SPADs) integrated on the same chip enable the effective compensation of dark count rate (DCR) in the SPAD and also the real-time monitoring of the chip temperature. In the design, two identical SPA Ds are fabricated on the same chip. one operating normally and the other one covered by a metal layer to be kept in the dark. The two SPADs are identically biased and connected to identical active quench and reset integrated circuits. As both detectors are identical in structure. the dark count is expected to be similar for both. Experimental measurements show that the two SPADs exhibit similar DCR performance over a range of bias voltages and temperatures. By measuring the DCR from the covered SPAD, the DCR from the normally operated SPAD can be accounted for directly. This can he particularly useful for SPADs, where the DCR is high. Experiments under illumination show that the shaded SPAD is immune to illumination over a wide range of incident light power. This enables the real-time monitoring of the temperature on the sensor chip using the counting rate from the dark operated avalanche photodiode (APD). en
dc.format.mimetype application/pdf en
dc.language.iso en en
dc.publisher Institution of Engineering and Technology, IET en
dc.relation.uri http://digital-library.theiet.org/content/journals/10.1049/el.2018.0341
dc.rights © The Institution of Engineering and Technology 2018. This paper is a postprint of a paper submitted to and accepted for publication in Electronics Letters and is subject to Institution of Engineering and Technology Copyright. The copy of record is available at IET Digital Library. en
dc.subject Avalanche photodiodes en
dc.subject Integrated optoelectronics en
dc.subject Integrated optics en
dc.subject Photodetectors en
dc.subject Photon counting en
dc.subject Temperature sensors en
dc.subject Dual single-photon avalanche photodiodes en
dc.subject Incident light power en
dc.subject Normally operated SPAD en
dc.subject Temperature monitoring en
dc.subject Counting rate en
dc.subject Real-time monitoring en
dc.subject Bias voltages en
dc.subject Real-time dark count compensation en
dc.subject Similar DCR performance en
dc.subject Chip temperature en
dc.subject Identical active quench en
dc.subject Dark count rate compensation en
dc.subject Integrated circuits en
dc.subject Dual SPADs en
dc.subject Shaded SPAD en
dc.subject Sensor chip en
dc.title Real-time dark count compensation and temperature monitoring using dual SPADs on the same chip en
dc.type Article (peer-reviewed) en
dc.internal.authorcontactother Alan Morrison, Engineering Faculty Office, University College Cork, Cork, Ireland. +353-21-490-3000 Email: a.morrison@ucc.ie en
dc.internal.availability Full text available en
dc.date.updated 2018-06-28T13:18:50Z
dc.description.version Accepted Version en
dc.internal.rssid 439007162
dc.internal.wokid WOS:000432187600020
dc.contributor.funder Science Foundation Ireland en
dc.description.status Peer reviewed en
dc.identifier.journaltitle Electronics Letters en
dc.internal.copyrightchecked No !!CORA!! en
dc.internal.licenseacceptance Yes en
dc.internal.IRISemailaddress a.morrison@ucc.ie en


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