Defect transfer from nanoparticles to nanowires

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Date
2011-04
Authors
Barth, Sven
Boland, John J.
Holmes, Justin D.
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Publisher
American Chemical Society (ACS)
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Research Projects
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Abstract
Metal-seeded growth of one-dimensional (1D) semiconductor nanostructures is still a very active field of research, despite the huge progress which has been made in understanding this fundamental phenomenon. Liquid growth promoters allow control of the aspect ratio, diameter, and structure of 1D crystals via external parameters, such as precursor feedstock, temperature, and operating pressure. However the transfer of crystallographic information from a catalytic nanoparticle seed to a growing nanowire has not been described in the literature. Here we define the theoretical requirements for transferring defects from nanoparticle seeds to growing semiconductor nanowires and describe why Ag nanoparticles are ideal candidates for this purpose. We detail in this paper the influence of solid Ag growth seeds on the crystal quality of Ge nanowires, synthesized using a supercritical fluid growth process. Significantly, under certain reaction conditions {111} stacking faults in the Ag seeds can be directly transferred to a high percentage of ⟨112⟩-oriented Ge nanowires, in the form of radial twins in the semiconductor crystals. Defect transfer from nanoparticles to nanowires could open up the possibility of engineering 1D nanostructures with new and tunable physical properties and morphologies.
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Keywords
Defects , Germanium , Nanocrystal , Nanowire , SFSS , Silver , Solid-phase seeding
Citation
Barth, S., Boland, J. J. and Holmes, J. D. (2011) 'Defect Transfer from Nanoparticles to Nanowires', Nano Letters, 11(4), pp. 1550-1555. doi: 10.1021/nl104339w
Copyright
© 2011 American Chemical Society. This document is the Accepted Manuscript version of a Published Work that appeared in final form in Nano Letters, copyright © American Chemical Society after peer review and technical editing by the publisher. To access the final edited and published work see https://pubs.acs.org/doi/10.1021/nl104339w