dc.contributor.author |
Caruso, Enrico |
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dc.contributor.author |
Lin, Jun |
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dc.contributor.author |
Burke, K. F. |
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dc.contributor.author |
Cherkaoui, Karim |
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dc.contributor.author |
Esseni, David |
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dc.contributor.author |
Gity, Farzan |
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dc.contributor.author |
Monaghan, Scott |
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dc.contributor.author |
Palestri, Pierpaolo |
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dc.contributor.author |
Hurley, Paul K. |
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dc.contributor.author |
Selmi, Luca |
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dc.date.accessioned |
2018-11-30T12:23:22Z |
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dc.date.available |
2018-11-30T12:23:22Z |
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dc.date.issued |
2018-06 |
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dc.identifier.citation |
Caruso, E., Lin, J., Burke, K. F.; Cherkaoui, K., Esseni, D.; Gity, F., Monaghan, S., Palestri, P.; Hurley, P. K.; Selmi, L. (2018) ‘Physics-based TCAD analysis of border and interface traps in Al2O3/InGaAs stacks using multifrequency CV-curves’, 20th Workshop on Dielectrics in Microelectronics - WODIM 2018, Berlin, Germany, 10-14 June. |
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dc.identifier.uri |
http://hdl.handle.net/10468/7160 |
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dc.description.abstract |
In this paper, we analyze the multi-frequency C-V curves of In0.53Ga0.47As MOSCAPs by employing physics-based TCAD simulations including both border and interface traps. The calculations reproduce the experimental inversion and accumulation capacitance, and the general trend of the depletion capacitance. A study of the influence of the quantization model on the extraction of the trap distribution is also carried out. |
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dc.format.mimetype |
application/pdf |
en |
dc.language.iso |
en |
en |
dc.rights |
© 2018, the Authors. All rights reserved. |
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dc.subject |
TCAD |
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dc.subject |
Depletion capacitance |
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dc.subject |
Quantization model |
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dc.title |
Physics-based TCAD analysis of border and interface traps in Al2O3/InGaAs stacks using multifrequency CV-curves |
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dc.type |
Conference item |
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dc.internal.authorcontactother |
Enrico Caruso, Tyndall National Institute, University College Cork, Cork, Ireland. T: +353-21-490-3000 E: enrico.caruso@tyndall.ie |
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dc.internal.availability |
Full text available |
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dc.description.version |
Submitted Version |
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dc.internal.rssid |
463811371 |
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dc.description.status |
Peer reviewed |
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dc.internal.IRISemailaddress |
enrico.caruso@tyndall.ie |
en |