Study at UCC |
Current Students |
Research |
Staff |
Teaching & Learning |
Visitors |
Alumni |
About UCC
JavaScript is disabled for your browser. Some features of this site may not work without it.
| dc.contributor.author | Caruso, Enrico | |
| dc.contributor.author | Lin, Jun | |
| dc.contributor.author | Burke, K. F. | |
| dc.contributor.author | Cherkaoui, Karim | |
| dc.contributor.author | Esseni, D. | |
| dc.contributor.author | Gity, Farzan | |
| dc.contributor.author | Monaghan, Scott | |
| dc.contributor.author | Palestri, P. | |
| dc.contributor.author | Hurley, Paul K. | |
| dc.contributor.author | Selmi, L. | |
| dc.date.accessioned | 2018-11-30T12:23:22Z | |
| dc.date.available | 2018-11-30T12:23:22Z | |
| dc.date.issued | 2018-06 | |
| dc.identifier.citation | Caruso, E., Lin, J., Burke, K. F.; Cherkaoui, K., Esseni, D.; Gity, F., Monaghan, S., Palestri, P.; Hurley, P. K.; Selmi, L. (2018) ‘Physics-based TCAD analysis of border and interface traps in Al2O3/InGaAs stacks using multifrequency CV-curves’, 20th Workshop on Dielectrics in Microelectronics - WODIM 2018, Berlin, Germany, 10-14 June. | en |
| dc.identifier.uri | http://hdl.handle.net/10468/7160 | |
| dc.description.abstract | In this paper, we analyze the multi-frequency C-V curves of In0.53Ga0.47As MOSCAPs by employing physics-based TCAD simulations including both border and interface traps. The calculations reproduce the experimental inversion and accumulation capacitance, and the general trend of the depletion capacitance. A study of the influence of the quantization model on the extraction of the trap distribution is also carried out. | en |
| dc.format.mimetype | application/pdf | en |
| dc.language.iso | en | en |
| dc.rights | © 2018, the Authors. All rights reserved. | en |
| dc.subject | TCAD | en |
| dc.subject | Depletion capacitance | en |
| dc.subject | Quantization model | en |
| dc.title | Physics-based TCAD analysis of border and interface traps in Al2O3/InGaAs stacks using multifrequency CV-curves | en |
| dc.type | Conference item | en |
| dc.internal.authorcontactother | Enrico Caruso, Tyndall National Institute, University College Cork, Cork, Ireland. T: +353-21-490-3000 E: enrico.caruso@tyndall.ie | en |
| dc.internal.availability | Full text available | en |
| dc.description.version | Submitted Version | en |
| dc.internal.rssid | 463811371 | |
| dc.description.status | Peer reviewed | en |
