Electrical characterization of bismuth sulfide nanowire arrays by conductive atomic force microscopy

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dc.contributor.author Birjukovs, Pavels
dc.contributor.author Petkov, Nikolay
dc.contributor.author Xu, Ju
dc.contributor.author Svirksts, Janis
dc.contributor.author Boland, John J.
dc.contributor.author Holmes, Justin D.
dc.contributor.author Erts, Donats
dc.date.accessioned 2019-07-12T11:55:18Z
dc.date.available 2019-07-12T11:55:18Z
dc.date.issued 2008-11-14
dc.identifier.citation Birjukovs, P., Petkov, N., Xu, J., Svirksts, J., Boland, J. J., Holmes, J. D. and Erts, D. (2008) 'Electrical Characterization of Bismuth Sulfide Nanowire Arrays by Conductive Atomic Force Microscopy', The Journal of Physical Chemistry C, 112(49), pp. 19680-19685. doi: 10.1021/jp805422k en
dc.identifier.volume 112 en
dc.identifier.startpage 19680 en
dc.identifier.endpage 19685 en
dc.identifier.issn 1932-7447
dc.identifier.uri http://hdl.handle.net/10468/8155
dc.identifier.doi 10.1021/jp805422k en
dc.description.abstract A new method for determining the resistivity of templated Bi2S3 nanowires by conductive atomic force (C-AFM) microscopy is described in this paper. Unlike other vertical C-AFM approaches, in our method, resistance measurements were carried out along the lengths of the nanowires. Nanowires embedded within anodic alumina membranes were exposed for contact by etching away the alumina template to form an open array of parallel nanowires. From these measurements, the contact resistance between the gold electrodes and the C-AFM probe could be determined and subtracted to give the intrinsic resistivity of the nanowires. The resistivity of the nanowires determined in such a horizontal configuration was 10−100 times lower than the resistivity determined when the same nanowires were contacted in a vertical configuration. en
dc.description.sponsorship Trinity College Dublin (Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN)); European Regional Development Fund (ERAF/Eiropas Regionalas Attistibas Fonds) en
dc.format.mimetype application/pdf en
dc.language.iso en en
dc.publisher American Chemical Society, ACS en
dc.relation.uri https://pubs.acs.org/doi/full/10.1021/jp805422k
dc.rights © 2008 American Chemical Society. This document is the Accepted Manuscript version of a Published Work that appeared in final form in The Journal of Physical Chemistry C, copyright © American Chemical Society after peer review and technical editing by the publisher. To access the final edited and published work see https://pubs.acs.org/doi/full/10.1021/jp805422k en
dc.subject Electric wire en
dc.subject Atomic force microscopy en
dc.subject Bismuth en
dc.subject Nanowires en
dc.subject AFM en
dc.subject Afm probes en
dc.subject Alumina templates en
dc.subject Anodic alumina membranes en
dc.subject Bismuth sulfide nanowires en
dc.subject Conductive atomic force microscopies en
dc.subject Conductive-atomic forces en
dc.subject Electrical characterizations en
dc.subject Gold electrodes en
dc.subject Intrinsic resistivities en
dc.subject Open arrays en
dc.subject Parallel nanowires en
dc.subject Resistance measurements en
dc.subject Templated en
dc.subject Cadmium compounds en
dc.subject Bismuth sulfide en
dc.title Electrical characterization of bismuth sulfide nanowire arrays by conductive atomic force microscopy en
dc.type Article (non peer-reviewed) en
dc.internal.authorcontactother Justin D. Holmes, Chemistry, University College Cork, Cork, Ireland. +353-21-490-3000 Email: j.holmes@ucc.ie en
dc.internal.availability Full text available en
dc.date.updated 2019-06-28T15:54:00Z
dc.description.version Accepted Version en
dc.internal.rssid 22017839
dc.contributor.funder Science Foundation Ireland en
dc.contributor.funder Trinity College Dublin en
dc.contributor.funder Ministry of Education and Science, Republic of Latvia en
dc.contributor.funder European Regional Development Fund en
dc.description.status Peer reviewed en
dc.identifier.journaltitle Journal of Physical Chemistry C en
dc.internal.copyrightchecked No
dc.internal.licenseacceptance Yes en
dc.internal.IRISemailaddress j.holmes@ucc.ie en
dc.relation.project info:eu-repo/grantAgreement/SFI/SFI Principal Investigator Programme (PI)/03/IN.3/I375/IE/The assembly of electronically important materials as structurally and size controlled nanowires into 3-dimensional architectures and construction of Prototype circuitry there from./ en


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