Atomic layer deposition of metals: Precursors and film growth

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Date
2019-11-05
Authors
Hagen, D. J.
Pemble, Martyn E.
Karppinen, M.
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AIP Publishing
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Abstract
The coating of complex three-dimensional structures with ultrathin metal films is of great interest for current technical applications, particularly in microelectronics, as well as for basic research on, for example, photonics or spintronics. While atomic layer deposition (ALD) has become a well-established fabrication method for thin oxide films on such geometries, attempts to develop ALD processes for elemental metal films have met with only mixed success. This can be understood by the lack of suitable precursors for many metals, the difficulty in reducing the metal cations to the metallic state, and the nature of metals as such, in particular their tendency to agglomerate to isolated islands. In this review, we will discuss these three challenges in detail for the example of Cu, for which ALD has been studied extensively due to its importance for microelectronic fabrication processes. Moreover, we give a comprehensive overview over metal ALD, ranging from a short summary of the early research on the ALD of the platinoid metals, which has meanwhile become an established technology, to very recent developments that target the ALD of electropositive metals. Finally, we discuss the most important applications of metal ALD.
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Keywords
Atomic layer deposition , ALD , Elemental metal film , Cu
Citation
Hagen, D. J., Pemble, M. E. and Karppinen, M. (2019) 'Atomic layer deposition of metals: Precursors and film growth', Applied Physics Reviews, 6(4), 041309. doi: 10.1063/1.5087759
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© 2019, the Authors. Published by AIP Publishing. This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared as Hagen, D. J., Pemble, M. E. and Karppinen, M. (2019) 'Atomic layer deposition of metals: Precursors and film growth', Applied Physics Reviews, 6(4), 041309. doi: 10.1063/1.5087759, and may be found at https://doi.org/10.1063/1.5087759