Enhanced Bragg reflections from size-matched heterostructure photonic crystal thin films prepared by the Langmuir-Blodgett method

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Enhanced Bragg reflections from size-matched heterostructure photonic crystal thin films prepared by the Langmuir-Blodgett method

Bardosova, M.; Pemble, M. E.; Povey, I. M.; Tredgold, R. H.; Whitehead, D. E.
Date: 2006
Copyright: © 2006 American Institute of Physics.This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. The following article appeared in Bardosova, M., Pemble, M. E., Povey, I. M., Tredgold, R. H. and Whitehead, D. E. (2006) 'Enhanced Bragg reflections from size-matched heterostructure photonic crystal thin films prepared by the Langmuir-Blodgett method', Applied Physics Letters, 89(9), pp. 093116 and may be found at http://aip.scitation.org/doi/abs/10.1063/1.2339031
Related: http://aip.scitation.org/doi/abs/10.1063/1.2339031
Citation: Bardosova, M., Pemble, M. E., Povey, I. M., Tredgold, R. H. and Whitehead, D. E. (2006) 'Enhanced Bragg reflections from size-matched heterostructure photonic crystal thin films prepared by the Langmuir-Blodgett method', Applied Physics Letters, 89(9), pp. 093116.
Published Version: 10.1063/1.2339031

Abstract:

The Langmuir-Blodgett method was used to engineer photonic crystal thin films of an AB architecture. Structures were studied by transmittance and reflectance spectroscopies. For an AB structure in which the silica particle diameter B is twice that of A, reflectance features associated with the first order Bragg peak for the "A" domain are only observed when the structure is probed from the A side of the structure. Furthermore, this feature is enhanced in intensity compared to that for a structure consisting solely of A particles. These findings are attributed to a matching of first and second order Bragg processes. (c) 2006 American Institute of Physics. (DOI:10.1063/1.2339031)

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