Transpolyacetylene chains in hydrogenated amorphous carbon films free of nanocrystalline diamond

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Date
2003
Authors
Piazza, F.
Golanski, A.
Schulze, S.
Relihan, Gary
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AIP Publishing
Published Version
10.1063/1.1538349
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Abstract
The microstructure of distributed electron cyclotron resonance plasma-deposited hydrogenated amorphous carbon films (a-C:H) was investigated using electron diffraction, Raman spectroscopy, and Fourier transform infrared spectroscopy. Experimental evidence of the existence of transpolyacetylene (TPA) chains in a-C:H films free of nanocrystalline diamond is presented. The values of the mean bond angles and lengths and first neighbor numbers are consistent with the TPA data. The Raman spectra were fitted using the G and D bands and the bands centered at 1140, 1233, and 1475 cm(-1) assigned to TPA chains modes. The relative intensity of the latter decreases while hydrogen content decreases. A significant sp(2)-CH olefinic mode contribution to the infrared stretching band is observed for the low-density films (similar to1.2 g/cm(3)). TPA chains growth is enhanced when ion current density and energy decrease. (C) 2003 American Institute of Physics. (DOI: 10.1063/1.1538349)
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Keywords
Multiphoton processes , Diamond , Carbon , Thin film structure , Elemental semiconductors
Citation
Piazza, F., Golanski, A., Schulze, S. and Relihan, G. (2003) 'Transpolyacetylene chains in hydrogenated amorphous carbon films free of nanocrystalline diamond', Applied Physics Letters, 82(3), pp. 358-360. doi: 10.1063/1.1538349
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http://aip.scitation.org/doi/abs/10.1063/1.1538349
URI
https://hdl.handle.net/10468/4403
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Tyndall National Institute - Journal Articles
Copyright
© 2003 American Institute of Physics.This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. The following article appeared in Piazza, F., Golanski, A., Schulze, S. and Relihan, G. (2003) 'Transpolyacetylene chains in hydrogenated amorphous carbon films free of nanocrystalline diamond', Applied Physics Letters, 82(3), pp. 358-360 and may be found at http://aip.scitation.org/doi/abs/10.1063/1.1538349