Fast shuttling of a trapped ion in the presence of noise

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Fast shuttling of a trapped ion in the presence of noise

Lu, Xiao-Jing; Muga, Juan Gonzalo; Chen, Xi; Poschinger, U. G.; Schmidt-Kaler, F.; Ruschhaupt, Andreas
Date: 2014
Copyright: © 2014, American Physical Society
Related: https://journals.aps.org/pra/abstract/10.1103/PhysRevA.89.063414
Citation: Lu, X.-J., Muga, J. G., Chen, X., Poschinger, U. G., Schmidt-Kaler, F. and Ruschhaupt, A. (2014) 'Fast shuttling of a trapped ion in the presence of noise', Physical Review A, 89(6), 063414 (10pp). doi: 10.1103/PhysRevA.89.063414
Published Version: 10.1103/PhysRevA.89.063414

Abstract:

We theoretically investigate the motional excitation of a single ion caused by spring-constant and position fluctuations of a harmonic trap during trap shuttling processes. A detailed study of the sensitivity on noise for several transport protocols and noise spectra is provided. The effect of slow spring-constant drifts is also analyzed. Trap trajectories that minimize the excitation are designed combining invariant-based inverse engineering, perturbation theory, and optimal control.

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