Piezoresponse force microscopy investigations of Aurivillius phase thin films

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dc.contributor.authorKeeney, Lynette
dc.contributor.authorZhang, Panfeng F.
dc.contributor.authorGroh, Claudia
dc.contributor.authorPemble, Martyn E.
dc.contributor.authorWhatmore, Roger W.
dc.contributor.funderScience Foundation Irelanden
dc.contributor.funderEuropean Commissionen
dc.date.accessioned2016-08-16T08:46:43Z
dc.date.available2016-08-16T08:46:43Z
dc.date.issued2010-08-31
dc.date.updated2014-09-03T10:37:28Z
dc.description.abstractThe sol-gel synthesis and characterization of n≥3n≥3 Aurivillius phase thin filmsdeposited on Pt/Ti/SiO2–SiPt/Ti/SiO2–Si substrates is described. The number of perovskite layers, nn, was increased by inserting BiFeO3BiFeO3 into three layered Aurivillius phase Bi4Ti3O12Bi4Ti3O12 to form compounds such as Bi5FeTi3O15Bi5FeTi3O15 (n=4)(n=4). 30% of the Fe3+Fe3+ ions in Bi5FeTi3O15Bi5FeTi3O15 were substituted with Mn3+Mn3+ ions to form the structureBi5Ti3Fe0.7Mn0.3O15Bi5Ti3Fe0.7Mn0.3O15. The electromechanical responses of the materials were investigated using piezoresponse force microscopy and the results are discussed in relation to the crystallinity of the films as measured by x-ray diffraction.en
dc.description.sponsorshipScience Foundation Ireland (SFI FORME Strategic Research Cluster Award No. 07/SRC/I1172); European Commission (European Union CAMELIA Specific Targeted Research or Innovation Project Contract No. STRP 033103 i)en
dc.description.statusPeer revieweden
dc.description.versionPublished Versionen
dc.format.mimetypeapplication/pdfen
dc.identifier.articleid042004
dc.identifier.citationKeeney, L., Zhang, P. F., Groh, C., Pemble, M. E. and Whatmore, R. W. (2010) ‘Piezoresponse force microscopy investigations of Aurivillius phase thin films’, Journal of Applied Physics, 108, 042004. http://dx.doi.org/10.1063/1.3474959en
dc.identifier.doi10.1063/1.3474959
dc.identifier.endpage042004-9en
dc.identifier.issn0021-8979
dc.identifier.issn1089-7550
dc.identifier.journaltitleJournal of Applied Physicsen
dc.identifier.startpage042004-1en
dc.identifier.urihttps://hdl.handle.net/10468/2991
dc.identifier.volume108en
dc.language.isoenen
dc.publisherAIP Publishingen
dc.rights© 2010 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. The following article appeared in L. Keeney et al., J. Appl. Phys. 108, 042004 (2010) and may be found at http://dx.doi.org/10.1063/1.3474959en
dc.subjectAnnealingen
dc.subjectAtomic force microscopyen
dc.subjectX-ray diffractionen
dc.subjectPolarizationen
dc.subjectSolsen
dc.titlePiezoresponse force microscopy investigations of Aurivillius phase thin filmsen
dc.typeArticle (peer-reviewed)en
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