Co-based amorphous thin films on silicon with soft magnetic properties

cb
Thumbnail Image
Files
4478.pdf(3.72 MB)
Published Version
Date
2017
Authors
Masood, Ansar
McCloskey, Paul
Ó Mathúna, S. Cian
Kulkarni, Santosh
Journal Title
Journal ISSN
Volume Title
Publisher
AIP Publishing
Published Version
10.1063/1.5007733
Research Projects
Organizational Units
Journal Issue
Abstract
The present work investigates the emergence of multiple modes in the high-frequency permeability spectrum of Co-Zr-Ta-B amorphous thin films. Amorphous thin films of different thicknesses (t=100-530 nm) were deposited by DC magnetron sputtering. Their static and dynamic soft magnetic properties were investigated to explore the presence of multi-magnetic phases in the films. A two-phase magnetic behavior of the thicker films (≥333 nm) was revealed by the in-plane hysteresis loops. Multiple resonance peaks were observed in the high-frequency permeability spectrum of the thicker films. The thickness dependent multiple resonance peaks below the main ferromagnetic resonance (FMR) can be attributed to the two-phase magnetic behaviors of the films.
Description
Keywords
Condensed matter properties , Thin films , Magnetic materials , Ferromagnetic resonance , Physical vapor deposition
Citation
Masood, A., McCloskey, P., Mathúna, C. Ó. and Kulkarni, S. (2018) 'Co-based amorphous thin films on silicon with soft magnetic properties', AIP Advances, 8(5), 056109(6pp). doi: 10.1063/1.5007733
Link to publisher’s version
http://aip.scitation.org/doi/10.1063/1.5007733
URI
https://hdl.handle.net/10468/5412
Collections
Tyndall National Institute - Journal Articles
Electrical and Electronic Engineering - Journal Articles
Copyright
© 2017, the Authors. All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).