Optical reflectance of solution processed quasi-superlattice ZnO and Al-doped ZnO (AZO) channel materials

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dc.contributor.authorBuckley, Darragh
dc.contributor.authorMcCormack, Robert
dc.contributor.authorO'Dwyer, Colm
dc.contributor.funderIrish Research Councilen
dc.contributor.funderScience Foundation Irelanden
dc.date.accessioned2017-04-27T10:19:55Z
dc.date.available2017-04-27T10:19:55Z
dc.date.issued2017-03-24
dc.date.updated2017-04-27T10:04:09Z
dc.description.abstractThe angle-resolved reflectance of high crystalline quality, c-axis oriented ZnO and AZO single and periodic quasi-superlattice (QSL) spin-coated TFT channels materials are presented. The data is analysed using an adapted model to accurately determine the spectral region for optical thickness and corresponding reflectance. The optical thickness agrees very well with measured thickness of 1–20 layered QSL thin films determined by transmission electron microscopy if the reflectance from lowest interference order is used. Directional reflectance for single layers or homogeneous QSLs of ZnO and AZO channel materials exhibit a consistent degree of anti-reflection characteristics from 30 to 60° (~10–12% reflection) for thickness ranging from ~40 nm to 500 nm. The reflectance of AZO single layer thin films is  <10% from 30 to 75° at 514.5 nm, and  <6% at 632.8 nm from 30–60°. The data show that ZnO and AZO with granular or periodic substructure behave optically as dispersive, continuous thin films of similar thickness, and angle-resolved spectral mapping provides a design rule for transparency or refractive index determination as a function of film thickness, substructure (dispersion) and viewing angle.en
dc.description.sponsorshipIrish Research Council (Award GOIPG/2014/206); Science Foundation Ireland (SFI Grants 15/TIDA/2893 and 14/IA/2581)en
dc.description.statusPeer revieweden
dc.description.versionPublished Versionen
dc.format.mimetypeapplication/pdfen
dc.identifier.articleid16LT01
dc.identifier.citationBuckley, D., McCormack, R. and O'Dwyer, C. (2017) 'Optical reflectance of solution processed quasi-superlattice ZnO and Al-doped ZnO (AZO) channel materials', Journal of Physics D - Applied Physics, 50, 16LT01 (7pp). doi:10.1088/1361-6463/aa6559en
dc.identifier.doi10.1088/1361-6463/aa6559
dc.identifier.endpage7en
dc.identifier.issn0022-3727
dc.identifier.journaltitleJournal of Physics D - Applied Physicsen
dc.identifier.startpage1en
dc.identifier.urihttps://hdl.handle.net/10468/3894
dc.identifier.volume50en
dc.language.isoenen
dc.publisherIOP Publishingen
dc.rights© 2017 IOP Publishing Ltd. Original content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.en
dc.rights.urihttps://creativecommons.org/licenses/by/3.0/en
dc.subjectThin filmsen
dc.subjectZnOen
dc.subjectAZOen
dc.subjectReflectanceen
dc.subjectSolution processeden
dc.subjectTFTen
dc.titleOptical reflectance of solution processed quasi-superlattice ZnO and Al-doped ZnO (AZO) channel materialsen
dc.typeArticle (peer-reviewed)en
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