Epitaxial growth of antimony nanofilms on HOPG and thermal desorption to control the film thickness

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dc.contributor.authorXing, Shuyaen
dc.contributor.authorLei, Leen
dc.contributor.authorDong, Haoyuen
dc.contributor.authorGuo, Jianfengen
dc.contributor.authorCao, Feiyueen
dc.contributor.authorGu, Shangzhien
dc.contributor.authorHussain, Sabiren
dc.contributor.authorPang, Feien
dc.contributor.authorJi, Weien
dc.contributor.authorXu, Ruien
dc.contributor.authorCheng, Zhihaien
dc.contributor.funderNational Natural Science Foundation of Chinaen
dc.contributor.funderNational Key Research and Development Program of Chinaen
dc.contributor.funderUniversity of Chinese Academy of Sciencesen
dc.contributor.funderCentral Universities in Chinaen
dc.contributor.funderFundamental Research Funds for the Central Universitiesen
dc.contributor.funderRenmin University of Chinaen
dc.date.accessioned2024-01-10T15:38:13Z
dc.date.available2024-01-03T14:23:54Zen
dc.date.available2024-01-10T15:38:13Z
dc.date.issued2020-07-03en
dc.date.updated2024-01-03T14:23:56Zen
dc.description.abstractGroup-V elemental nanofilms were predicted to exhibit interesting physical properties such as nontrivial topological properties due to their strong spin-orbit coupling, the quantum confinement, and surface effect. It was reported that the ultrathin Sb nanofilms can undergo a series of topological transitions as a function of the film thickness h: from a topological semimetal (h > 7.8 nm) to a topological insulator (7.8 nm > h > 2.7 nm), then a quantum spin Hall (QSH) phase (2.7 nm > h > 1.0 nm) and a topological trivial semiconductor (h > 1.0 nm). Here, we report a comprehensive investigation on the epitaxial growth of Sb nanofilms on highly oriented pyrolytic graphite (HOPG) substrate and the controllable thermal desorption to achieve their specific thickness. The morphology, thickness, atomic structure, and thermal-strain effect of the Sb nanofilms were characterized by a combination study of scanning electron microscopy (SEM), atomic force microscopy (AFM), and scanning tunneling microscopy (STM). The realization of Sb nanofilms with specific thickness paves the way for the further exploring their thickness-dependent topological phase transitions and exotic physical properties.en
dc.description.sponsorshipNational Natural Science Foundation of China (Grant Nos. 21622304, 61674045, 11604063, and 61911540074); National Key Research and Development Program of China (Grant No. 2016YFA0200700); Chinese Academy of Sciences (The Strategic Priority Research Program and Key Research Program of Frontier Sciences and Instrument Developing Project (Chinese Academy of Sciences, CAS) (Grant Nos. XDB30000000, QYZDB-SSW-SYS031, and YZ201418); Distinguished Technical Talents Project and Youth Innovation Promotion Association CAS)); Fundamental Research Funds for the Central Universities, China, and the Research Funds of Renmin University of China (Grant No. 18XNLG01).en
dc.description.statusPeer revieweden
dc.description.versionPublished Versionen
dc.format.mimetypeapplication/pdfen
dc.identifier.articleid096801en
dc.identifier.citationXing, S., Lei, L., Dong, H., Guo, J., Cao, F., Gu, S., Hussain, S., Pang, F., Ji, W., Xu, R. and Cheng, Z. (2020) ‘Epitaxial growth of antimony nanofilms on HOPG and thermal desorption to control the film thickness*’, Chinese Physics B, 29(9), p. 096801. Available at: https://doi.org/10.1088/1674-1056/aba27cen
dc.identifier.doi10.1088/1674-1056/aba27cen
dc.identifier.endpage9en
dc.identifier.issn1674-1056en
dc.identifier.journaltitleChinese Physics Ben
dc.identifier.startpage1en
dc.identifier.urihttps://hdl.handle.net/10468/15349
dc.identifier.volume29en
dc.language.isoenen
dc.publisherIOP Publishingen
dc.relation.urihttps://doi.org/10.1088/1674-1056/aba27cen
dc.rights© 2020 Chinese Physical Society and IOP Publishing Ltden
dc.subjectEpitaxial growthen
dc.subjectAntimony filmsen
dc.subjectScanning tunneling microscope (STM)en
dc.subjectThermal desorptionen
dc.titleEpitaxial growth of antimony nanofilms on HOPG and thermal desorption to control the film thicknessen
dc.typeArticle (peer-reviewed)en
dc.typeArticleen
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