A fully automated measurement system for the characterization of micro thermoelectric devices near room temperature
dc.contributor.author | Tanwar, Amit | en |
dc.contributor.author | Lal, Swatchith | en |
dc.contributor.author | Kaur, Rajvinder | en |
dc.contributor.author | Padmanathan, Narayanasamy | en |
dc.contributor.author | Dalton, Eric | en |
dc.contributor.author | Razeeb, Kafil M. | en |
dc.contributor.funder | Horizon 2020 Framework Programme | en |
dc.contributor.funder | Science Foundation Ireland | en |
dc.contributor.funder | European Regional Development Fund | en |
dc.date.accessioned | 2023-08-31T15:24:18Z | |
dc.date.available | 2023-08-31T15:24:18Z | |
dc.date.issued | 2023 | en |
dc.description.abstract | In this work, we report the customized design and development of a fully automated measurement system to characterize the temperature-dependent properties of microscale thermoelectric devices. The featured system can characterize the devices up to a dimension of 8.79 × 8.79 mm2 in an atmospheric environment. Commercially available bismuth telluride-based thermoelectric modules (both thermoelectric generator and thermoelectric cooler) are used to validate the feasibility and accuracy of the developed system. Their performance data is analysed and compared with the available manufacturer datasheet. The measured data from these devices are found to be in good agreement with the anticipated values and showed an acceptable deviation of less than 4% in the output performances. The developed setup is simple to operate and suitable for performance evaluation of both macro and micro-thermoelectric devices. The system accurately reproduces application conditions the module may be subjected to in a real-world environment. | en |
dc.description.status | Peer reviewed | en |
dc.description.version | Published Version | en |
dc.format.mimetype | application/pdf | en |
dc.identifier.articleid | 120111 | en |
dc.identifier.citation | Tanwar, A., Lal, S., Kaur, R., Padmanathan, N., Dalton, E. and Razeeb, K.M. (2023) ‘A fully automated measurement system for the characterization of micro thermoelectric devices near room temperature’, Applied Thermal Engineering, 224, 120111 (9 pp). https://doi.org/10.1016/j.applthermaleng.2023.120111 | en |
dc.identifier.doi | 10.1016/j.applthermaleng.2023.120111 | en |
dc.identifier.eissn | 1873-5606 | en |
dc.identifier.endpage | 9 | en |
dc.identifier.issn | 1359-4311 | en |
dc.identifier.journaltitle | Applied Thermal Engineering | en |
dc.identifier.startpage | 1 | en |
dc.identifier.uri | https://hdl.handle.net/10468/14894 | |
dc.identifier.volume | 224 | en |
dc.language.iso | en | en |
dc.publisher | Elsevier | en |
dc.relation.ispartof | Applied Thermal Engineering | en |
dc.relation.project | info:eu-repo/grantAgreement/EC/H2020::RIA/825114/EU/Smart Autonomous Multi Modal Sensors for Vital Signs Monitoring/SmartVista | en |
dc.relation.project | info:eu-repo/grantAgreement/EC/H2020::RIA/964251/EU/The Recycling of waste heat through the Application of Nanofluidic ChannelS: Advances in the Conversion of Thermal to Electrical energy/TRANSLATE | en |
dc.relation.project | info:eu-repo/grantAgreement/SFI/SFI Investigator Programme/15/IA/3160/IE/Thermoelectric efficiency of IV-VI and V2-VI3 materials driven near phase transitions/ | en |
dc.relation.project | info:eu-repo/grantAgreement/SFI/SFI Research Centres/12/RC/2276/IE/I-PIC Irish Photonic Integration Research Centre/ | en |
dc.relation.project | info:eu-repo/grantAgreement/SFI/SFI Research Centres/13/RC/2077/IE/CONNECT: The Centre for Future Networks & Communications/ | en |
dc.rights | © 2023 The Author(s). Published by Elsevier Ltd. This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/). | en |
dc.rights.uri | http://creativecommons.org/licenses/by/4.0/ | en |
dc.subject | Thermoelectric devices (TEDs) | en |
dc.subject | Thermal resistance | en |
dc.subject | Cooling power | en |
dc.subject | COP | en |
dc.subject | Measurement system | en |
dc.title | A fully automated measurement system for the characterization of micro thermoelectric devices near room temperature | en |
dc.type | Article (peer-reviewed) | en |
oaire.citation.volume | 224 | en |