Laser beam characterization using agile digital-analog photonics

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dc.contributor.authorSheikh, Mumtaz
dc.contributor.authorMarraccini, Philip
dc.contributor.authorRiza, Nabeel A.
dc.date.accessioned2020-06-02T09:48:13Z
dc.date.available2020-06-02T09:48:13Z
dc.date.issued2010-04-20
dc.description.abstractPrecise knowledge of laser beam parameters is a key requirement in many photonics applications including for lasers and optics used in the transportation industry. This paper reports on a novel motion-free laser beam characterization system using electronically agile digital and analog photonics such as a Digital Micromirror Device (DMD) and an analog variable focal length lens. The proposed system has the capability of measuring all the parameters of a laser beam including minimum waist size, minimum waist location, beam divergence and the beam propagation parameter (M2). Experimental results demonstrate the measurement of the minimum beam waist size and location for a test 633 nm fundamental mode Gaussian laser beam. The system is also applicable for imaging of arbitrary beams including non-laser beams.en
dc.description.statusPeer revieweden
dc.description.versionPublished Versionen
dc.format.mimetypeapplication/pdfen
dc.identifier.articleid767508en
dc.identifier.citationSheikh, M., Marraccini, P. and Riza, N. A. (2010) 'Laser beam characterization using agile digital-analog photonics", Proceedings of SPIE, 7675, Photonics in the Transportation Industry: Auto to Aerospace III, 767508, SPIE Defense, Security, and Sensing, 2010, Orlando, Florida, United States, 20 April 2010 doi: 10.1117/12.849686en
dc.identifier.doi10.1117/12.849686en
dc.identifier.eissn1996-756X
dc.identifier.endpage6en
dc.identifier.issn0277-786X
dc.identifier.journaltitleProceedings of SPIEen
dc.identifier.startpage1en
dc.identifier.urihttps://hdl.handle.net/10468/10093
dc.identifier.volume7675en
dc.language.isoenen
dc.publisherSociety of Photo-Optical Instrumentation Engineers (SPIE)en
dc.rights© 2010 Society of Photo-Optical Instrumentation Engineers (SPIE). One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.en
dc.subjectBeam parametersen
dc.subjectGaussian beamsen
dc.subjectDigital Micromirror Deviceen
dc.subjectBeam Profiler and Imageren
dc.subjectImaging systemsen
dc.subjectDigital micromirror devicesen
dc.subjectBeam analyzersen
dc.subjectPhotonicsen
dc.subjectLaser beam characterizationen
dc.subjectLaser beam propagationen
dc.subjectAnalog electronicsen
dc.titleLaser beam characterization using agile digital-analog photonicsen
dc.typeConference itemen
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