Growth and characterization of anodic Films on InP in KOH and (NH4)2S

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dc.contributor.authorHarvey, E.
dc.contributor.authorO'Dwyer, Colm
dc.contributor.authorMelly, T.
dc.contributor.authorBuckley, D. Noel
dc.contributor.authorCunnane, V. J.
dc.contributor.authorSutton, David
dc.contributor.authorNewcomb, Simon B.
dc.date.accessioned2016-07-14T13:51:32Z
dc.date.available2016-07-14T13:51:32Z
dc.date.issued2001-03
dc.date.updated2012-11-30T12:17:57Z
dc.description.abstractThe current-voltage characteristics of InP were investigated in (NH4)2S and KOH electrolytes. In both solutions, the observation of current peaks in the cyclic voltammetric curves was attributed to the growth of passivating films. The relationship between the peak currents and the scan rates suggests that the film formation process is diffusion controlled in both cases. The film thickness required to inhibit current flow was found to be much lower on samples anodized in the sulphide solution. Focused ion beam (FIB) secondary electron images of the surface films show that film cracking of the type reported previously for films grown in (NH4)2S is also observed for films grown in KOH. X-ray and electron diffraction measurements indicate the presence of In2O3 and InPO4 in films grown in KOH and In2S3 in films grown in (NH4)2S.en
dc.description.statusPeer revieweden
dc.description.versionAccepted Versionen
dc.format.mimetypeapplication/pdfen
dc.identifier.citationHarvey, E., O’Dwyer, C., Melly, T., Buckley, D. N., Cunnane, V. J., Sutton, D. and Newcomb, S. B. (2001) 'Growth and Characterization of Anodic Films on InP in KOH and (NH4)2S', III-Nitride Based Semiconductor Electronic and Optical Devices and State-of-the-Art Program on Compound Semiconductors XXXIV, 199th ECS Meeting, Washington, D.C., 25-30 March. in Proceedings - Electrochemical Society, Vol. 1, p. 204-212. ISBN 1-56677-306-5.en
dc.identifier.endpage212
dc.identifier.isbn1-56677-306-5
dc.identifier.journaltitleProceedings - Electrochemical Societyen
dc.identifier.startpage204en
dc.identifier.urihttps://hdl.handle.net/10468/2877
dc.identifier.volume1en
dc.language.isoenen
dc.publisherElectrochemical Societyen
dc.relation.urihttp://www.electrochem.org/199
dc.relation.urihttp://ecsdl.org/site/misc/proceedings_volumes.xhtmlen
dc.rights© 2001, Electrochemical Societyen
dc.subjectPorous InPen
dc.subjectKOH electrolytesen
dc.subjectAnodic formationen
dc.titleGrowth and characterization of anodic Films on InP in KOH and (NH4)2Sen
dc.typeConference itemen
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