Exploratory study and application of the angular wavelet analysis for assessing the spatial distribution of breakdown spots in Pt/HfO2/Pt structures

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dc.contributor.authorMuñoz-Gorriz, J.
dc.contributor.authorMonaghan, Scott
dc.contributor.authorCherkaoui, Karim
dc.contributor.authorSuñé, Jordi
dc.contributor.authorHurley, Paul K.
dc.contributor.authorMiranda, E.
dc.contributor.funderGeneralitat de Catalunyaen
dc.contributor.funderEuropean Commissionen
dc.contributor.funderDepartament d'Universitats, Recerca i Societat de la Informacióen
dc.contributor.funderSeventh Framework Programmeen
dc.date.accessioned2022-06-29T10:26:49Z
dc.date.available2022-06-29T10:26:49Z
dc.date.issued2017-12-05
dc.date.updated2022-06-27T12:09:56Z
dc.description.abstractThe angular wavelet analysis is applied for assessing the spatial distribution of breakdown spots in Pt/HfO2/Pt capacitors with areas ranging from 104 to 105 μm2. The breakdown spot lateral sizes are in the range from 1 to 3 μm, and they appear distributed on the top metal electrode as a point pattern. The spots are generated by ramped and constant voltage stresses and are the consequence of microexplosions caused by the formation of shorts spanning the dielectric film. This kind of pattern was analyzed in the past using the conventional spatial analysis tools such as intensity plots, distance histograms, pair correlation function, and nearest neighbours. Here, we show that the wavelet analysis offers an alternative and complementary method for testing whether or not the failure site distribution departs from a complete spatial randomness process in the angular domain. The effect of using different wavelet functions, such as the Haar, Sine, French top hat, Mexican hat, and Morlet, as well as the roles played by the process intensity, the location of the voltage probe, and the aspect ratio of the device, are all discussed.en
dc.description.sponsorshipEuropean Commission (ENIAC Joint Undertaking under the PANACHE EU Project); Generalitat de Catalunya (Grant No. 2014SGR384)en
dc.description.statusPeer revieweden
dc.description.versionAccepted Versionen
dc.format.mimetypeapplication/pdfen
dc.identifier.articleid215304en
dc.identifier.citationMuñoz-Gorriz, J., Monaghan, S., Cherkaoui, K., Suñé, J., Hurley, P. K. and Miranda, E. (2017) 'Exploratory study and application of the angular wavelet analysis for assessing the spatial distribution of breakdown spots in Pt/HfO2/Pt structures', Journal of Applied Physics, 122, 215304 (12pp). doi: 10.1063/1.5000004en
dc.identifier.doi10.1063/1.5000004en
dc.identifier.eissn1089-7550
dc.identifier.endpage12en
dc.identifier.issn0021-8979
dc.identifier.issued21en
dc.identifier.journaltitleJournal of Applied Physicsen
dc.identifier.startpage1en
dc.identifier.urihttps://hdl.handle.net/10468/13330
dc.identifier.volume122en
dc.language.isoenen
dc.publisherAIP Publishingen
dc.relation.projectinfo:eu-repo/grantAgreement/EC/FP7::SP1::ENERGY/608512/EU/ASCENT - Advanced Solid Cycles with Efficient Novel Technologies/ASCENTen
dc.rights© 2017, the Authors. This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared as: Muñoz-Gorriz, J., Monaghan, S., Cherkaoui, K., Suñé, J., Hurley, P. K. and Miranda, E. (2017) 'Exploratory study and application of the angular wavelet analysis for assessing the spatial distribution of breakdown spots in Pt/HfO2/Pt structures', Journal of Applied Physics, 122, 215304 (12pp), doi: 10.1063/1.5000004, and may be found at: https://doi.org/10.1063/1.5000004en
dc.subjectAngular wavelet analysisen
dc.titleExploratory study and application of the angular wavelet analysis for assessing the spatial distribution of breakdown spots in Pt/HfO2/Pt structuresen
dc.typeArticle (peer-reviewed)en
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