Absence of evidence ≠ evidence of absence: statistical analysis of inclusions in multiferroic thin films

dc.contributor.authorSchmidt, Michael
dc.contributor.authorAmann, Andreas
dc.contributor.authorKeeney, Lynette
dc.contributor.authorPemble, Martyn E.
dc.contributor.authorHolmes, Justin D.
dc.contributor.authorPetkov, Nikolay
dc.contributor.authorWhatmore, Roger W.
dc.contributor.funderScience Foundation Irelanden
dc.date.accessioned2016-02-25T17:23:59Z
dc.date.available2016-02-25T17:23:59Z
dc.date.issued2014-07-16
dc.description.abstractAssertions that a new material may offer particularly advantageous properties should always be subjected to careful critical evaluation, especially when those properties can be affected by the presence of inclusions at trace level. This is particularly important for claims relating to new multiferroic compounds, which can easily be confounded by unobserved second phase magnetic inclusions. We demonstrate an original methodology for the detection, localization and quantification of second phase inclusions in thin Aurivillius type films. Additionally, we develop a dedicated statistical model and demonstrate its application to the analysis of Bi6Ti2.8Fe1.52Mn0.68O18 (B6TFMO) thin films, that makes it possible to put a high, defined confidence level (e.g. 99.5%) to the statement of ‘new single phase multiferroic materials’. While our methodology has been specifically developed for magnetic inclusions, it can easily be adapted to any other material system that can be affected by low level inclusions.en
dc.description.sponsorshipScience Foundation Ireland (SFI FORME Strategic Research Cluster Award number 07/SRC/I1172, Starting Investigator Research Grant (09/SIRG/I1621) and (09/SIRG/I1615))en
dc.description.statusPeer revieweden
dc.description.versionPublished Versionen
dc.format.mimetypeapplication/pdfen
dc.identifier.citationSCHMIDT, M., AMANN, A., KEENEY, L., PEMBLE, M. E., HOLMES, J. D., PETKOV, N. & WHATMORE, R. W. 2014. Absence of Evidence ≠ Evidence of Absence: Statistical Analysis of Inclusions in Multiferroic Thin Films. Scientific Reports, 4, 5712. http://dx.doi.org/10.1038/srep05712en
dc.identifier.doi10.1038/srep05712
dc.identifier.endpage5712 (8)en
dc.identifier.issn2045-2322
dc.identifier.journaltitleScientific Reportsen
dc.identifier.startpage5712 (1)en
dc.identifier.urihttps://hdl.handle.net/10468/2405
dc.identifier.volume4en
dc.language.isoenen
dc.publisherNature Publishing Group, Macmillan Publishers Limiteden
dc.rights© Schmidt et al, 2014; licensee Nature Publishing Group, 2015. This work is licensed under a Creative Commons Attribution-NonCommercialNoDerivs 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder in order to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by-nc-nd/4.0/en
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/en
dc.subjectNew multiferroic compoundsen
dc.subjectMagnetic inclusionsen
dc.subjectB6TFMOen
dc.subjectThin filmsen
dc.subjectMicroscopyen
dc.subjectMicroanalysisen
dc.titleAbsence of evidence ≠ evidence of absence: statistical analysis of inclusions in multiferroic thin filmsen
dc.typeArticle (peer-reviewed)en
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