Surface quality and surface waves on subwavelength-structured silver films

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dc.contributor.authorGay, G.
dc.contributor.authorAlloschery, O.
dc.contributor.authorWeiner, J.
dc.contributor.authorLezec, H. J.
dc.contributor.authorO'Dwyer, Colm
dc.contributor.authorSukharev, M.
dc.contributor.authorSeideman, T.
dc.contributor.funderThe Région Midi-Pyrénées. Franceen
dc.contributor.funderMinistère délégué à l’Enseignement supérieur et à la Recherche, Franceen
dc.contributor.funderEuropean Commissionen
dc.contributor.funderCaltech Kavli Nanoscience Institute, United Statesen
dc.contributor.funderAir Force Office of Scientific Researchen
dc.contributor.funderNational Energy Research Scientific Computing Center, United Statesen
dc.contributor.funderSan Diego Supercomputer Center, United Statesen
dc.date.accessioned2016-07-05T13:49:51Z
dc.date.available2016-07-05T13:49:51Z
dc.date.issued2007-01-24
dc.date.updated2012-11-29T21:33:50Z
dc.description.abstractWe analyze the physical-chemical surface properties of single-slit, single-groove subwavelength-structured silver films with high-resolution transmission electron microscopy and calculate exact solutions to Maxwell’s equations corresponding to recent far-field interferometry experiments using these structures. Contrary to a recent suggestion the surface analysis shows that the silver films are free of detectable contaminants. The finite-difference time-domain calculations, in excellent agreement with experiment, show a rapid fringe amplitude decrease in the near zone (slit-groove distance out to 3–4 wavelengths). Extrapolation to slit-groove distances beyond the near zone shows that the surface wave evolves to the expected bound surface plasmon polariton (SPP). Fourier analysis of these results indicates the presence of a distribution of transient, evanescent modes around the SPP that dephase and dissipate as the surface wave evolves from the near to the far zone.en
dc.description.sponsorshipMinistère délégué à l’Enseignement supérieur et à la Recherche (Programme ACI “Nanosciences-Nanotechnologies,”); The Région MidiPyrénées (Grant No. SFC/CR 02/22); European Commission (FASTNet Grant No. HPRN-CT-2002-00304 EU Research Training Network); Caltech Kavli Nanoscience Institute; Air Force Office of Scientific Research (AFOSR Plasmon MURI Grant No. FA9550-04-1-0434); National Energy Research Scientific Computing Center; U.S. Department of Energy (Contract No. DE-AC03-76SF00098); San Diego Supercomputer Center (Grant No.PHY050001)en
dc.description.statusPeer revieweden
dc.description.versionAccepted Versionen
dc.format.mimetypeapplication/pdfen
dc.identifier.articleid016612
dc.identifier.citationGay, G., Alloschery, O., Weiner, J. ,Lezec, H. J. ,O'Dwyer, C. ,Sukharev, M. and Seideman, T. (2007) 'Surface quality and surface waves on subwavelength-structured silver films'. Physical Review E, 75, 016612. http://link.aps.org/doi/10.1103/PhysRevE.75.016612en
dc.identifier.doi10.1103/PhysRevE.75.016612
dc.identifier.endpage016612 (4)en
dc.identifier.issn2470-0053
dc.identifier.issn2470-0045
dc.identifier.journaltitlePhysical Review Een
dc.identifier.startpage016612 (1)en
dc.identifier.urihttps://hdl.handle.net/10468/2824
dc.identifier.volume75en
dc.language.isoenen
dc.publisherAmerican Physical Societyen
dc.rights© 2007 American Physical Societyen
dc.subjectFinite difference methoden
dc.subjectInterferometryen
dc.subjectSilveren
dc.subjectSurface structureen
dc.subjectSurface wavesen
dc.subjectTime domain analysisen
dc.subjectTransmission electron microscopyen
dc.titleSurface quality and surface waves on subwavelength-structured silver filmsen
dc.typeArticle (peer-reviewed)en
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