Ferroelectric behavior in exfoliated 2D Aurivillius oxide flakes of sub-unit cell thickness

dc.contributor.authorKeeney, Lynette
dc.contributor.authorSmith, Ronan J.
dc.contributor.authorPalizdar, Meghdad
dc.contributor.authorSchmidt, Michael
dc.contributor.authorBell, Andrew J.
dc.contributor.authorColeman, Jonathan N.
dc.contributor.authorWhatmore, Roger W.
dc.contributor.funderScience Foundation Irelanden
dc.contributor.funderRoyal Societyen
dc.date.accessioned2020-02-18T12:09:07Z
dc.date.available2020-02-18T12:09:07Z
dc.date.issued2020-01-30
dc.date.updated2020-02-18T11:57:47Z
dc.description.abstractFerroelectricity in ultrasonically exfoliated flakes of the layered Aurivillius oxide Bi5Ti3Fe0.5Co0.5O15 with a range of thicknesses is studied. These flakes have relatively large areas (linear dimensions many times the film thickness), thus classifying them as 2D materials. It is shown that ferroelectricity can exist in flakes with thicknesses of only 2.4 nm, which equals one‐half of the normal crystal unit cell. Piezoresponse force microscopy (PFM) demonstrates that these very thin flakes exhibit both piezoelectric effects and that the ferroelectric polarization can be reversibly switched. A new model is presented that permits the accurate modeling of the field‐on and field‐off PFM time domain and hysteresis loop responses from a ferroelectric during switching in the presence of charge injection, storage, and decay through a Schottky barrier at the electrode–oxide interface. The extracted values of spontaneous polarization, 0.04(±0.02) C m−2 and electrostrictive coefficient, 2(±0.1) × 10−2 m4 C−2 are in good agreement with other ferroelectric Aurivillius oxides. Coercive field scales with thickness, closely following the semi‐empirical scaling law expected for ferroelectric materials. This constitutes the first evidence for ferroelectricity in a 2D oxide material, and it offers the prospect of new devices that might use the useful properties associated with the switchable ferroelectric spontaneous polarization in a 2D materials format.en
dc.description.sponsorshipRoyal Society and Science Foundation Ireland (University Research Fellowship UF 140263)en
dc.description.statusPeer revieweden
dc.description.versionAccepted Versionen
dc.format.mimetypeapplication/pdfen
dc.identifier.articleid1901264en
dc.identifier.citationKeeney, L., Smith, R. J., Palizdar, M., Schmidt, M., Bell, A. J., Coleman, J. N. and Whatmore, R. W. (2020) 'Ferroelectric behavior in exfoliated 2D Aurivillius oxide flakes of sub-unit cell thickness', Advanced Electronic Materials, 1901264 (12pp). doi: 10.1002/aelm.201901264en
dc.identifier.doi10.1002/aelm.201901264en
dc.identifier.eissn2199-160X
dc.identifier.endpage12en
dc.identifier.journaltitleAdvanced Electronic Materialsen
dc.identifier.startpage1en
dc.identifier.urihttps://hdl.handle.net/10468/9656
dc.language.isoenen
dc.publisherJohn Wiley & Sons, Inc.en
dc.relation.projectinfo:eu-repo/grantAgreement/SFI/SFI Strategic Research Cluster/07/SRC/I1172/IE/SRC FORME: Functional Oxides and Related Materials for Electronics/en
dc.relation.urihttps://onlinelibrary.wiley.com/doi/abs/10.1002/aelm.201901264
dc.rights© 2020, WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. This is the peer reviewed version of the following article: Keeney, L., Smith, R. J., Palizdar, M., Schmidt, M., Bell, A. J., Coleman, J. N. and Whatmore, R. W. (2020) 'Ferroelectric behavior in exfoliated 2D Aurivillius oxide flakes of sub-unit cell thickness', Advanced Electronic Materials, 1901264 (12pp), doi: 10.1002/aelm.201901264, which has been published in final form at https://doi.org/10.1002/aelm.201901264. This article may be used for non-commercial purposes in accordance with Wiley Terms and Conditions for Use of Self-Archived Versions.en
dc.subject2D materialsen
dc.subjectFerroelectricsen
dc.subjectSemiconductorsen
dc.subjectUltra-thin electronicen
dc.titleFerroelectric behavior in exfoliated 2D Aurivillius oxide flakes of sub-unit cell thicknessen
dc.typeArticle (peer-reviewed)en
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