Novel high frequency electrical characterization technique for magnetic passive devices

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dc.contributor.authorFernandez, Cristina
dc.contributor.authorPavlović, Zoran
dc.contributor.authorKulkarni, Santosh
dc.contributor.authorMcCloskey, Paul
dc.contributor.authorÓ Mathúna, S. Cian
dc.contributor.funderSeventh Framework Programmeen
dc.contributor.funderScience Foundation Irelanden
dc.contributor.funderMinisterio de Economía y Competitividaden
dc.contributor.funderEuropean Regional Development Funden
dc.date.accessioned2018-02-27T12:33:39Z
dc.date.available2018-02-27T12:33:39Z
dc.date.issued2018-01-28
dc.date.updated2018-02-27T12:12:24Z
dc.description.abstractIntegrated magnetic components are key elements of the Power Supply on Chip modules. Due to the application requirements, these magnetic devices work at very high frequency and have low inductances. Conventional small-signal tests do not provide all the required information about the magnetic device. Hence, it is important to develop new set-ups to apply large signals to accurately measure the performance of devices under realistic operating conditions, including non-linear core effects. The proposed experimental set-up is suitable to measure the device impedance under different large-signal test conditions, similar to those in the actual converter, since the excitation current can be configured through every winding: ac current up to 0.5 A at frequencies up to 120 MHz and dc bias current up to 2 A through one or both windings. Voltage and current are measured using commercial instrumentation. Due to the characteristics of the probes and the high frequency of the test, the attenuation and delay due to the probes and the experimental set-up have to be taken into account when processing the voltage and current waveforms to calculate the impedances. The compensation test to calculate this attenuation and delay is described. Finally, the proposed set-up is validated by measuring a two-phase coupled inductors micro-fabricated on silicon.en
dc.description.sponsorshipMinisterio de Economía y Competitividad (Spanish Ministry of Economy and Competitiveness and FEDER funds (projects DPI2014-53685-C2-1-R and DPI2017-88062-R)en
dc.description.statusPeer revieweden
dc.description.versionAccepted Versionen
dc.format.mimetypeapplication/pdfen
dc.identifier.citationFernandez, C., Pavlovic, Z., Kulkarni, S., McCloskey, P. and Mathúna, C. Ó. (2018) 'Novel High Frequency Electrical Characterization technique for Magnetic Passive Devices', IEEE Journal of Emerging and Selected Topics in Power Electronics, 6(2), pp. 621-628. doi: 10.1109/JESTPE.2018.2798919en
dc.identifier.doi10.1109/JESTPE.2018.2798919
dc.identifier.endpage628en
dc.identifier.issn2168-6777
dc.identifier.issued2en
dc.identifier.journaltitleIEEE Journal of Emerging and Selected Topics in Power Electronicsen
dc.identifier.startpage621en
dc.identifier.urihttps://hdl.handle.net/10468/5552
dc.identifier.volume6en
dc.language.isoenen
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en
dc.relation.projectinfo:eu-repo/grantAgreement/EC/FP7::SP1::ICT/318529/EU/POWER SoC With Integrated PassivEs/POWERSWIPEen
dc.relation.projectinfo:eu-repo/grantAgreement/SFI/SFI Investigator Programme/15/IA/3180/IE/Advanced Integrated Power Magnetics Technology- From Atoms to Systems/en
dc.rights© 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.en
dc.subjectCurrent measurementen
dc.subjectImpedanceen
dc.subjectImpedance measurementen
dc.subjectInductorsen
dc.subjectMagnetic coresen
dc.subjectProbesen
dc.subjectVoltage measurementen
dc.subjectdc-dc convertersen
dc.subjectIntegrated magneticsen
dc.subjectLarge signal testingen
dc.subjectThin-film inductorsen
dc.titleNovel high frequency electrical characterization technique for magnetic passive devicesen
dc.typeArticle (peer-reviewed)en
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