Automatic ASET sensitivity evaluation of a custom-designed 180nm CMOS technology operational amplifier

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dc.contributor.authorFontana, Andrésen
dc.contributor.authorPazos, Sebastian M.en
dc.contributor.authorAguirre, Fernando L.en
dc.contributor.authorPalumbo, Felixen
dc.date.accessioned2025-10-13T08:49:28Z
dc.date.available2025-10-13T08:49:28Z
dc.date.issued2017-10-05en
dc.description.abstractThis work presents a SPICE-based automatic SET sensitivity evaluation of a 180nm CMOS full-custom Operational Amplifier. The set-up uses the well known double exponential current law to inject SET into every sensitive node in the circuit hierarchy. The pulse parameters are obtained according to a previously generated population of particles with randomly assigned energies and species, the node bias condition at the instant of the strike and an empirical model obtained through TCAD simulations. The circuit is evaluated transistor-wise for each ion of the generated database and the output waveforms are processed in time and frequency domain to obtain figures of merit of the hardness of the proposed design on a given radioactive environment. Results allow to identify the most sensitive devices and the expected error rate for the projected application, allowing to conduct hardening techniques during early design stages.en
dc.description.statusPeer revieweden
dc.description.versionAccepted Versionen
dc.format.mimetypeapplication/pdfen
dc.identifier.citationFontana, A., Pazos, S. M., Aguirre, F. L. and Palumbo, F. (2017) 'Automatic ASET sensitivity evaluation of a custom-designed 180nm CMOS technology operational amplifier', 2017 Argentine Conference of Micro-Nanoelectronics, Technology and Applications (CAMTA), Buenos Aires, Argentina, 27-28 July 2017, pp. 21-25. https://doi.org/10.1109/CAMTA.2017.8058136en
dc.identifier.doi10.1109/camta.2017.8058136en
dc.identifier.endpage25en
dc.identifier.isbn978-1-5090-6671-1en
dc.identifier.isbn978-1-5090-6670-4en
dc.identifier.isbn978-1-5090-6672-8en
dc.identifier.startpage21en
dc.identifier.urihttps://hdl.handle.net/10468/18021
dc.language.isoenen
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en
dc.relation.ispartof2017 Argentine Conference of Micro-Nanoelectronics, Technology and Applications (CAMTA), Buenos Aires, Argentina, 27-28 July 2017en
dc.rights© 2017, IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.en
dc.subjectASETen
dc.subjectAnalog CMOSen
dc.subjectSPICEen
dc.subjectHeavy ionsen
dc.titleAutomatic ASET sensitivity evaluation of a custom-designed 180nm CMOS technology operational amplifieren
dc.typeConference itemen
dc.typeproceedings-articleen
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