Anodic oxidation of InP in KOH electrolytes
dc.contributor.author | O'Dwyer, Colm | |
dc.contributor.author | Melly, T. | |
dc.contributor.author | Harvey, E. | |
dc.contributor.author | Buckley, D. Noel | |
dc.contributor.author | Cunnane, V. J. | |
dc.contributor.author | Sutton, David | |
dc.contributor.author | Serantoni, M. | |
dc.contributor.author | Newcomb, Simon B. | |
dc.date.accessioned | 2016-07-15T08:31:41Z | |
dc.date.available | 2016-07-15T08:31:41Z | |
dc.date.issued | 2002-10 | |
dc.date.updated | 2012-11-30T12:15:24Z | |
dc.description.abstract | The anodic behavior of InP in 1 mol dm-3 KOH was investigated and compared with its behavior at higher concentrations of KOH. At concentrations of 2 mol dm-3 KOH or greater, selective etching of InP occurs leading to thick porous InP layers near the surface of the sustrate. In contrast, in 1 mol dm-3 KOH, no such porous layers are formed but a thin surface film is formed at potentials in the range 0.6 V to 1.3 V. The thickness of this film was determined by spectroscopic ellipsometry as a function of the upper potential and the measured film thickness corresponds to the charge passed up to a potential of 1.0 V. Anodization to potentials above 1.5 V in 1 mol dm- 3 KOH results in the growth of thick, porous oxide films (~ 1.2 µm). These films are observed to crack, ex-situ, due to shrinkage after drying in ambient air. Comparisons between the charge density and film thickness measurements indicate a porosity of approximately 77% for such films. | en |
dc.description.status | Peer reviewed | en |
dc.description.version | Accepted Version | en |
dc.format.mimetype | application/pdf | en |
dc.identifier.citation | O’Dwyer, C., Melly, T., Harvey, E., Buckley, D. N., Cunnane, V. J., Sutton, D., Serantoni, M. and Newcomb, S. B. (2002) 'Anodic Oxidation of InP in KOH Electrolytes', State-of-the-Art Program on Compound Semiconductors XXXVII (SOTAPOCS XXXVII) / Narrow Bandgap Optoelectronic Materials and Devices, 202nd ECS Meeting, Salt Lake City, Utah, 20-24 October, in Proceedings - Electrochemical Society, Vol. 14, pp. 233-240. ISBN 1-56677-306-5. | en |
dc.identifier.endpage | 240 | en |
dc.identifier.isbn | 1-56677-306-5. | |
dc.identifier.journaltitle | Proceedings - Electrochemical Society | en |
dc.identifier.startpage | 233 | en |
dc.identifier.uri | https://hdl.handle.net/10468/2883 | |
dc.identifier.volume | 14 | en |
dc.language.iso | en | en |
dc.publisher | Electrochemical Society | en |
dc.relation.uri | http://ecsdl.org/site/misc/proceedings_volumes.xhtml | |
dc.rights | © 2002, Electrochemical Society | en |
dc.subject | Transmission electron microscopy | en |
dc.subject | Spectroscopic ellipsometry | en |
dc.subject | Anodization | en |
dc.subject | Porous oxide films | en |
dc.title | Anodic oxidation of InP in KOH electrolytes | en |
dc.type | Conference item | en |