General approach to the analysis of plasmonic structures using spectroscopic ellipsometry

Simple item page
dc.contributor.authorVerre, R.
dc.contributor.authorModreanu, Mircea
dc.contributor.authorUalibek, O.
dc.contributor.authorFox, Daniel J.
dc.contributor.authorFleischer, K.
dc.contributor.authorSmith, C.
dc.contributor.authorZhang, Hongzhou
dc.contributor.authorPemble, Martyn E.
dc.contributor.authorMcGilp, J. F.
dc.contributor.authorShvets, I. V.
dc.contributor.funderHigher Education Authorityen
dc.contributor.funderScience Foundation Irelanden
dc.contributor.funderGovernment of the Republic of Kazakhstanen
dc.date.accessioned2014-01-30T10:02:16Z
dc.date.available2014-01-30T10:02:16Z
dc.date.issued2013-06
dc.date.updated2013-12-18T15:20:58Z
dc.description.abstractIn this article a route to analyze the full optical response of plasmonic structures is developed. First, the simple case of an anisotropic thin plasmonic layer supported on a transparent substrate is analyzed by introducing a quantity named anisotropic surface excess function (ASEF). The spectral features are analyzed in terms of effective dielectric function, demonstrating a more direct relation with the plasmonic response of the layer. The formalism is then generalized using a transfer matrix method. The formalism developed is supported by experimental evidence obtained by measuring the response of anisotropic nanoparticle arrays grown at a glancing angle. The agreement between theory and experiment is clear, suggesting that SE can be conveniently employed to measure the spectroscopic response of plasmonic structures. It is also demonstrated that the figure of merit of the plasmonic resonance for refractive index sensing can be greatly improved, with optimized measurement configurations, using polarized spectroscopy.en
dc.description.sponsorshipScience Foundation of Ireland, (06/IN.1/I91) (11/RFP.1/PHY/3047); Higher Education Authority (PRTLI 4 - INSPIRE programme); Government of the Republic of Kazakhstan (The Bolashak programme)en
dc.description.statusPeer revieweden
dc.description.versionAccepted Versionen
dc.format.mimetypeapplication/pdfen
dc.identifier.citationVERRE, R., MODREANU, M., UALIBEK, O., FOX, D., FLEISCHER, K., SMITH, C., ZHANG, H., PEMBLE, M., MCGILP, J. F. & SHVETS, I. V. 2013. General approach to the analysis of plasmonic structures using spectroscopic ellipsometry. Physical Review B, 87, 235428. doi: 10.1103/PhysRevB.87.235428en
dc.identifier.doi10.1103/PhysRevB.87.235428
dc.identifier.issn1098-0121
dc.identifier.issn1550-235X
dc.identifier.issued23en
dc.identifier.journaltitlePhysical Review Ben
dc.identifier.startpage235428en
dc.identifier.urihttps://hdl.handle.net/10468/1348
dc.identifier.volume87en
dc.language.isoenen
dc.publisherAmerican Physical Societyen
dc.relation.urihttp://link.aps.org/doi/10.1103/PhysRevB.87.235428
dc.rights©2013 American Physical Society.en
dc.subjectPlasmonicsen
dc.subjectSpectroscopic ellipsometryen
dc.titleGeneral approach to the analysis of plasmonic structures using spectroscopic ellipsometryen
dc.typeArticle (peer-reviewed)en
Files
Original bundle
Now showing 1 - 1 of 1
Thumbnail Image
Name:
R_Verre_formalism_for_plasmonic_structure_analysis_2013.pdf
Size:
2.09 MB
Format:
Adobe Portable Document Format
Description:
Accepted Version
Download
License bundle
Now showing 1 - 1 of 1
Thumbnail Image
Name:
license.txt
Size:
2.71 KB
Format:
Item-specific license agreed upon to submission
Description:
Download
Collections
Tyndall National Institute - Journal Articles