Directly observing squeezed phonon states with femtosecond x-ray diffraction

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dc.contributor.authorJohnson, Steve L.
dc.contributor.authorBeaud, Paul
dc.contributor.authorVorobeva, Ekaterina
dc.contributor.authorMilne, Christopher J.
dc.contributor.authorMurray, Éamonn D.
dc.contributor.authorFahy, Stephen B.
dc.contributor.authorIngold, Gerhard
dc.date.accessioned2017-09-08T09:15:48Z
dc.date.available2017-09-08T09:15:48Z
dc.date.issued2009
dc.description.abstractSqueezed states are quantum states of a harmonic oscillator in which the variance of two conjugate variables each oscillate out of phase. Ultrafast optical excitation of crystals can create squeezed phonon states, where the variance of the atomic displacements oscillates due to a sudden change in the interatomic bonding strength. With femtosecond x-ray diffraction we measure squeezing oscillations in bismuth and conclude that they are consistent with a model in which electronic excitation softens all phonon modes by a constant scaling factor.en
dc.description.statusPeer revieweden
dc.description.versionPublished Versionen
dc.format.mimetypeapplication/pdfen
dc.identifier.articleid175503
dc.identifier.citationJohnson, S. L., Beaud, P., Vorobeva, E., Milne, C. J., Murray, É. D., Fahy, S. and Ingold, G. (2009) 'Directly observing squeezed phonon states with femtosecond x-ray diffraction', Physical Review Letters, 102(17), 175503 (4pp). doi: 10.1103/PhysRevLett.102.175503en
dc.identifier.doi10.1103/PhysRevLett.102.175503
dc.identifier.issn0031-9007
dc.identifier.issued17
dc.identifier.journaltitlePhysical Review Lettersen
dc.identifier.urihttps://hdl.handle.net/10468/4642
dc.identifier.volume102
dc.language.isoenen
dc.publisherAmerican Physical Societyen
dc.relation.urihttps://journals.aps.org/prl/abstract/10.1103/PhysRevLett.102.175503
dc.rights© 2009, American Physical Societyen
dc.subjectCoherent phononsen
dc.subjectExcitationen
dc.subjectSolidsen
dc.subjectBismuthen
dc.subjectNoiseen
dc.subjectLight|Bien
dc.titleDirectly observing squeezed phonon states with femtosecond x-ray diffractionen
dc.typeArticle (peer-reviewed)en
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