Quantum-Dash semiconductor laser characterization using continuous tuning optical swept source

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dc.contributor.authorKorti, M.
dc.contributor.authorSlepneva, Svetlana
dc.contributor.authorHabruseva, T.
dc.contributor.authorMerghem, K.
dc.contributor.authorHuyet, G.
dc.contributor.authorGottesman, Y.
dc.contributor.authorRamdane, A.
dc.contributor.authorBenkelfat, B.-E.
dc.contributor.authorSeddiki, O.
dc.date.accessioned2019-03-11T13:02:31Z
dc.date.available2019-03-11T13:02:31Z
dc.date.issued2018
dc.description.abstractDevice characterization of Quantum-Dash semiconductor mode-locked laser using a continuous tuning swept source is presented. This technique is linear, simple and does not require any prior information about the signal under test.en
dc.description.statusPeer revieweden
dc.description.urihttps://www.osapublishing.org/abstract.cfm?URI=ASSL-2018-AM6A.23en
dc.description.versionPublished Versionen
dc.format.mimetypeapplication/pdfen
dc.identifier.articleidAM6A.23
dc.identifier.citationKorti, M., Slepneva, S., Habruseva, T., Merghem, K., Huyet, G., Gottesman, Y., Ramdane, A., Benkelfat, B.-E. and Seddiki, O. (2018) ‘Quantum-Dash semiconductor laser characterization using continuous tuning optical swept source’, in Proceedings of Laser Congress 2018 (Advanced Solid State Lasers), Boston, Massachusetts, United States, 4–8 November, AM6A.23 (2pp). doi: 10.1364/ASSL.2018.AM6A.23en
dc.identifier.doi10.1364/ASSL.2018.AM6A.23
dc.identifier.endpage2en
dc.identifier.isbn978-1-943580-48-4
dc.identifier.startpage1en
dc.identifier.urihttps://hdl.handle.net/10468/7601
dc.language.isoenen
dc.publisherOptical Society of Americaen
dc.relation.ispartofLaser Congress 2018 (Advanced Solid State Lasers)
dc.relation.urihttps://www.osapublishing.org/conference.cfm?meetingid=1&yr=2018
dc.rights© 2018, the Authors. Published by the Optical Society of America. All rights reserved.en
dc.subjectQuantum-Dash semiconductor laseren
dc.subjectMode-lockeden
dc.subjectContinuous tuning swept sourceen
dc.titleQuantum-Dash semiconductor laser characterization using continuous tuning optical swept sourceen
dc.typeConference itemen
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