Real-time experimental measurement of swept source VCSEL properties relevant to OCT imaging

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dc.contributor.authorButler, Thomas P.
dc.contributor.authorSlepneva, Svetlana
dc.contributor.authorMcNamara, P. M.
dc.contributor.authorNeuhaus, K.
dc.contributor.authorGoulding, David
dc.contributor.authorLeahy, M.
dc.contributor.authorHuyet, G.
dc.contributor.funderScience Foundation Ireland
dc.contributor.funderNational University of Ireland, Galway
dc.contributor.funderUniversity Foundation Galway
dc.contributor.funderUniversity of Limerick
dc.contributor.funderHigher Education Authority
dc.contributor.funderEuropean Commission
dc.contributor.funderUniversity of Limerick Foundation
dc.date.accessioned2018-06-15T11:47:14Z
dc.date.available2018-06-15T11:47:14Z
dc.date.issued2017
dc.description.abstractA real-time study of the dynamic properties of a frequency swept vertical cavity surface emitting laser (VCSEL) is presented. Such tunable laser sources have previously been shown to provide long coherence lengths and improved performance in metrology and imaging applications. Single-shot interferometric reconstruction of both the phase and intensity of the swept source allows for experimental measurement of the full complex electric field over multiple sweep periods. Access to the electric field enables direct measurement of laser properties that can be related to the imaging performance of the laser when used in a swept source optical coherence tomography application. Both inter-sweep and intra-sweep characterization is possible, including determination of the instantaneous spectral shape, sweep rate, linewidth, coherence roll-off, and point spread function.en
dc.description.sponsorshipHigher Education Authority / Irish Government / European Commission (PRTLI Cycle 4 - National Biophotonics Imaging Platform)en
dc.description.statusPeer reviewed
dc.description.versionPublished Versionen
dc.format.mimetypeapplication/pdfen
dc.identifier.articleid1505810
dc.identifier.citationButler, T. P., Slepneva, S., McNamara, P. M., Neuhaus, K., Goulding, D., Leahy, M. and Huyet, G. (2017) 'Real-time experimental measurement of swept source VCSEL properties relevant to OCT imaging', IEEE Photonics Journal, 9(5), 1505810 (11pp). doi: 10.1109/JPHOT.2017.2752644en
dc.identifier.doi10.1109/JPHOT.2017.2752644
dc.identifier.endpage11
dc.identifier.issn1943-0655
dc.identifier.issued5
dc.identifier.journaltitleIEEE Photonics Journalen
dc.identifier.startpage1
dc.identifier.urihttps://hdl.handle.net/10468/6338
dc.identifier.volume9
dc.language.isoenen
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en
dc.relation.project
dc.relation.projectinfo:eu-repo/grantAgreement/SFI/SFI Research Centres/12/RC/2276/IE/I-PIC Irish Photonic Integration Research Centre/
dc.relation.projectinfo:eu-repo/grantAgreement/SFI/SFI Principal Investigator Programme (PI)/11/PI/1152/IE/Frequency Combs Generated by Semiconductor Lasers for Metrology And Telecommunications/
dc.relation.urihttps://ieeexplore.ieee.org/document/8038247/
dc.rights© 2017, IEEE. Translations and content mining are permitted for academic research only. Personal use is also permitted, but republication/redistribution requires IEEE permission. See http://www.ieee.org/publications_standards/publications/rights/index.html for more information.en
dc.rights.urihttp://www.ieee.org/publications_standards/publications/rights/index.html
dc.subjectSemiconductor lasersen
dc.subjectOptical coherence tomographyen
dc.subjectOCTen
dc.titleReal-time experimental measurement of swept source VCSEL properties relevant to OCT imagingen
dc.typeArticle (peer-reviewed)en
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