Multimode laser beam characterization using agile digital-analog photonics

Show simple item record Marraccini, Philip Riza, Nabeel A. 2020-06-02T13:03:40Z 2020-06-02T13:03:40Z 2011-05-26
dc.identifier.citation Marraccini, P. J. and Riza, N. A. (2011) 'Multimode laser beam characterization using agile digital-analog photonics', Proceedings of SPIE, 8026, Photonic Applications for Aerospace, Transportation, and Harsh Environment II, 80260E, SPIE Defense, Security, and Sensing, 2011, Orlando, Florida, United States, 26 May. doi: 10.1117/12.885958 en
dc.identifier.volume 8026 en
dc.identifier.startpage 1 en
dc.identifier.endpage 4 en
dc.identifier.issn 0277-786X
dc.identifier.doi 10.1117/12.885958 en
dc.description.abstract Presented is a novel design of a multimode laser beam analyzer to enable beam measurements of minimum beam waist size, minimum waist location, divergence and the beam propagation parameter called M2. Experimental results demonstrate these measurements for a 532 nm multimode test laser beam. en
dc.format.mimetype application/pdf en
dc.language.iso en en
dc.publisher Society of Photo-Optical Instrumentation Engineers (SPIE) en
dc.rights © 2011 Society of Photo-Optical Instrumentation Engineers (SPIE). One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited. en
dc.subject DMD en
dc.subject Beam analyzer en
dc.subject Multimode beam characterization en
dc.subject Beam analyzers en
dc.subject Digital micromirror devices en
dc.subject Laser beam propagation en
dc.subject Photonics en
dc.subject Laser beam characterization en
dc.subject Digital photography en
dc.title Multimode laser beam characterization using agile digital-analog photonics en
dc.type Conference item en
dc.internal.authorcontactother Nabeel Riza, Electrical & Electronic Engineering, University College Cork, Cork, Ireland. +353-21-490-3000 Email: en
dc.internal.availability Full text available en
dc.description.version Published Version en
dc.description.status Peer reviewed en
dc.identifier.journaltitle Proceedings of SPIE en
dc.internal.conferencelocation Orlando, Florida, United States en
dc.internal.IRISemailaddress en
dc.identifier.articleid 80260E en
dc.identifier.eissn 1996-756X

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