On the robustness of R-2R ladder DACs
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Published Version
Date
2000-02
Authors
Kennedy, Michael Peter
Journal Title
Journal ISSN
Volume Title
Publisher
IEEE
Published Version
Abstract
A model of the linear R-2R ladder digital-to-analog converter (DAC) is developed in terms of the ratios of the effective resistances at the nodes of the ladder. This formulation demonstrates clearly why an infinite number of different sets of resistors can produce the same linearity error and shows how this error can be reduced by trimming. The relationship between the weights of the bits and the resistor ratios suggests appropriate trimming, design, and test strategies
Description
Keywords
Data converters , Resistive ladders , Mixed-signal circuits
Citation
Kennedy, M.P. , 2000. On the robustness of R-2R ladder DACs. IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications, 47(2), pp.109-116. doi: 10.1109/81.828565
Copyright
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