Piezoresponse force microscopy investigations of Aurivillius phase thin films

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Piezoresponse force microscopy investigations of Aurivillius phase thin films

Keeney, Lynette; Zhang, Panfeng F.; Groh, Claudia; Pemble, Martyn E.; Whatmore, Roger W.
Date: 2010-08-31
Copyright: © 2010 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. The following article appeared in L. Keeney et al., J. Appl. Phys. 108, 042004 (2010) and may be found at http://dx.doi.org/10.1063/1.3474959
Citation: Keeney, L., Zhang, P. F., Groh, C., Pemble, M. E. and Whatmore, R. W. (2010) ‘Piezoresponse force microscopy investigations of Aurivillius phase thin films’, Journal of Applied Physics, 108, 042004. http://dx.doi.org/10.1063/1.3474959
Published Version: 10.1063/1.3474959

Abstract:

The sol-gel synthesis and characterization of n≥3n≥3 Aurivillius phase thin filmsdeposited on Pt/Ti/SiO2–SiPt/Ti/SiO2–Si substrates is described. The number of perovskite layers, nn, was increased by inserting BiFeO3BiFeO3 into three layered Aurivillius phase Bi4Ti3O12Bi4Ti3O12 to form compounds such as Bi5FeTi3O15Bi5FeTi3O15 (n=4)(n=4). 30% of the Fe3+Fe3+ ions in Bi5FeTi3O15Bi5FeTi3O15 were substituted with Mn3+Mn3+ ions to form the structureBi5Ti3Fe0.7Mn0.3O15Bi5Ti3Fe0.7Mn0.3O15. The electromechanical responses of the materials were investigated using piezoresponse force microscopy and the results are discussed in relation to the crystallinity of the films as measured by x-ray diffraction.

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