Citation:Korti, M., Slepneva, S., Habruseva, T., Merghem, K., Huyet, G., Gottesman, Y., Ramdane, A., Benkelfat, B.-E. and Seddiki, O. (2018) ‘Quantum-Dash semiconductor laser characterization using continuous tuning optical swept source’, in Proceedings of Laser Congress 2018 (Advanced Solid State Lasers), Boston, Massachusetts, United States, 4–8 November, AM6A.23 (2pp). doi: 10.1364/ASSL.2018.AM6A.23
Device characterization of Quantum-Dash semiconductor mode-locked laser using a continuous tuning swept source is presented. This technique is linear, simple and does not require any prior information about the signal under test.
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