Quantum-Dash semiconductor laser characterization using continuous tuning optical swept source

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Quantum-Dash semiconductor laser characterization using continuous tuning optical swept source

Korti, M.; Slepneva, Svetlana; Habruseva, T.; Merghem, K.; Huyet, G.; Gottesman, Y.; Ramdane, A.; Benkelfat, B.-E.; Seddiki, O.
Date: 2018
Copyright: © 2018, the Authors. Published by the Optical Society of America. All rights reserved.
Related: https://www.osapublishing.org/conference.cfm?meetingid=1&yr=2018
Citation: Korti, M., Slepneva, S., Habruseva, T., Merghem, K., Huyet, G., Gottesman, Y., Ramdane, A., Benkelfat, B.-E. and Seddiki, O. (2018) ‘Quantum-Dash semiconductor laser characterization using continuous tuning optical swept source’, in Proceedings of Laser Congress 2018 (Advanced Solid State Lasers), Boston, Massachusetts, United States, 4–8 November, AM6A.23 (2pp). doi: 10.1364/ASSL.2018.AM6A.23
Published Version: 10.1364/ASSL.2018.AM6A.23

Abstract:

Device characterization of Quantum-Dash semiconductor mode-locked laser using a continuous tuning swept source is presented. This technique is linear, simple and does not require any prior information about the signal under test.

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